Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT

Downloads
Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_4844-KIT.STEP)
Document (4844-KIT__Kundenzeichnung.PDF)
Product datasheet (EN|pdf)
Document (4844-KIT_Montage.PDF)
Choose version
VA 2070S/i3070-5 (4844-KIT) INGUN SELECTION
VA 2070S/i3070-5 (4844-KIT) INGUN SELECTION
Here you can optionally configure a new variant:
Technical data
General data
Product group : Vacuum test fixture (VA)
Main series : VA xxxx
Series : VA 20xx
Series : VA 2070
Size : xx70
Test fixture type : Stand-alone test fixture
Contact stroke generation : Vacuum
Max. interface signals : 3666
Interface blocks required : No
Contacting direction : Single-sided (bottom)
Max. contact force : 11000 N
Approx. parallel contact stroke : 7 mm
DUT position (row-column) : 1,5/22,5 - 00/78
Test system interface : Keysight i3070-5
Weight : 12 kg
Min. temperature : + 10 °C
Max. temperature : + 60 °C
Low voltage : No
ESD-compliant : No
RoHS-compliant : RoHS-3;6a;6c
Technical data
Test probe installation height, bottom : 16 mm
Standard version : Yes
Useable area, standard (WxD) : 305 x 380 mm
ESD version : No
Radio frequency version : No
Rigid pin version : No
Dual-stage version : No
Additional contacting unit (ZSK), top : Yes, with suitable additional option
Outer dimensions, closed (WxDxH) : 465 x 460 x 100 mm

Board marker probes

Board marker probe   ME-E-R2,0-12-100-K12V Item 24456
  • Permanent marking of various materials
  • Precise, adjustable positioning
  • Outstanding service life, highly resistant to wear
  • Very easy installation
  • Electric drive system
Board marker probe   ME-E-R2,0-12-080-S12V Item 38371
  • Permanent marking of various materials
  • Precise, adjustable positioning
  • Outstanding service life, highly resistant to wear
  • Very easy installation
  • Electric drive system
Board marker probe   ME-P-F1,0-16-054-QS4 Item 29483
  • Permanent marking of various materials
  • Precise, adjustable positioning
  • Outstanding service life, highly resistant to wear
  • Very easy installation
  • Pneumatic drive system
Board marker probe   ME-E-R2,0-12-060-K12V Item 24447
  • Permanent marking of various materials
  • Precise, adjustable positioning
  • Outstanding service life, highly resistant to wear
  • Very easy installation
  • Electric drive system
Board marker probe   ME-P-S2,0-16-054-QS4 Item 25241
  • Permanent marking of various materials
  • Precise, adjustable positioning
  • Outstanding service life, highly resistant to wear
  • Very easy installation
  • Pneumatic drive system
Board marker probe   ME-E-S2,0-12-060-K12V Item 25251
  • Permanent marking of various materials
  • Precise, adjustable positioning
  • Outstanding service life, highly resistant to wear
  • Very easy installation
  • Electric drive system
Board marker probe   ME-E-R2,0-08-053-2S-BL6V-42V Item 107376
  • Short, compact design
  • Marking tip with a new dual scratching engraver
  • Precise, adjustable positioning
  • Quick-exchange engraving unit
  • Operating voltage from 6 V to 42 V
  • Permanent marking of various materials
  • Outstanding service life, highly resistant to wear
  • Typical extraction force from receptacle: 3 N to 9.5 N

Accessories

nanoVTEP connector test OTC-KS-NV-SP-155-013 Item 108706
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
nanoVTEP sensor plate 1.2 inch OTC-KS-NV-SP-031-031 Item 108704
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Pre-centring pin VZ-R-12-19-K Item 20616
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
Pre-centring pin VZ-R-06-13-K Item 25519
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
Detection - present FB-ABF-A-S-GKS-2 Item 105850
  • Upgrade kits to make operation easier, increase the testing reliability, and to reduce handling times
  • Available for manual test fixtures and exchangeable kits
  • Wide range of varying functions
nanoVTEP sensor plate 2.5 inch OTU-KS-NV-065-065 Item 109705
  • Reliable assemblies for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
DUT support PAS-02,8-04,0 Item 32995
  • Reliable plastic stamps for supporting PCBs
  • Robust, pressure-resistant, trusted design
  • Uniform tip height, various tip diameters available
  • Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
nanoVTEP single probe 0.4 inch OTC-KS-NV-SP-010-010 Item 108703
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
nanoVTEP amplifier OTC-KS-NV-EP Item 108707
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Vacuum seal VD-Z-19-XXX-XXX-2 Item 46795
  • Vacuum-free zone seal with variable dimensions
  • Compatible with VA 20xx 2-stage test fixtures
nanoVTEP test probe OTC-KS-NV-GKS Item 111606
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Pre-centring pin VZ-R-12-22-K-ESD Item 23056
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
nanoVTEP Connect Check signal C OTE-KS-NV-064-MUX-REF Item 108711
  • Reliable electronics control units for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
nanoVTEP signal conditioner board OTE-KS-NV-064-MUX Item 108710
  • Reliable electronics control units for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Pre-centring pin VZ-R-12-42-K-ESD Item 44253
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
Pre-centring pin VZ-R-12-22-K Item 13781
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
Pre-centring pin VZ-R-08-41-M-X Item 2519
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
DUT support PAS-05,8-03,0-FR4 Item 17806
  • Reliable plastic stamps for supporting PCBs
  • Robust, pressure-resistant, trusted design
  • Uniform tip height, various tip diameters available
  • Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
Pressure spring FED-10,0-16,0-97N-09,0 Item 1571
  • Trusted pressure springs, suitable for all test fixtures, exchangeable kits, and interchangeable kits
  • Highest spring steel quality for maximum breakage resistance
  • Various diameters available
  • Various spring forces available
nanoVTEP single probe 0.16 inch OTC-KS-NV-SP-004-004 Item 108701
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
nanoVTEP single probe B/C Size OTC-KS-NV-SP-007-004 Item 108702
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
DUT support PAS-02,8-05,0 Item 3161
  • Reliable plastic stamps for supporting PCBs
  • Robust, pressure-resistant, trusted design
  • Uniform tip height, various tip diameters available
  • Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
nanoVTEP sensor plate 2.5 inch OTC-KS-NV-SP-065-065 Item 108705
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
FrameScan Plus amplifier OTC-TD-FS-EP-GKS Item 14762
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Opensxpress connection board OTC-TS-OE-EP Item 22374
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
FrameScan Plus 0.500x6.25 inch OTC-TD-FS-SP-159-013 Item 14765
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Pre-centring pin VZ-R-08-26-M-X Item 2518
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
FrameScan Plus 1.25x1.25 inch OTC-TD-FS-SP-032-032 Item 14766
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
nanoVTEP connector test OTU-KS-NV-155-013 Item 109706
  • Reliable assemblies for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
FrameScan Plus 0.375×0.475 inch OTC-TD-FS-SP-013-010 Item 14763
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
FrameScan FX2.0 amplifier OTC-TD-FX-EP Item 26486
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Personality pin PP-INGUN-F Item 45000
  • Trusted personality pins for the assembly of test fixtures with Keysight test system interface
  • Flat head, wire-wrap posts, entirely gold-plated
  • Typical pitch distance of 3.81 mm (2.5 inches)
  • Reliable over several contact cycles and corrosion resistant over many years
Vacuum seal VD-Z-15-XXX-XXX Item 46794
  • Vacuum-free zone seal with variable dimensions
  • Compatible with VA 20xx 1-stage test fixtures
Pre-centring pin VZ-R-12-50-K Item 46758
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
DUT support PAS-02,8-03,0 Item 17990
  • Reliable plastic stamps for supporting PCBs
  • Robust, pressure-resistant, trusted design
  • Uniform tip height, various tip diameters available
  • Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
Pre-centring pin VZ-R-12-28-K Item 19462
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
nanoVTEP sensor plate 1.2 inch OTU-KS-NV-031-031 Item 109704
  • Reliable assemblies for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
FrameScan Plus 2.56x2.56 inch OTC-TD-FS-SP-065-065 Item 14767
  • Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
Pre-centring pin VZ-R-10-13-K Item 21628
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
Pre-centring pin VZ-R-12-22-K-X Item 42295
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available
Pre-centring pin VZ-R-12-35-K Item 50021
  • Trusted pre-centring pins for positioning the DUT on the probe field
  • Various diameters and heights available
  • Centric and eccentric design
  • Standard and ESD versions available

Side approach mechanism

Side approach mechanism SAM-M-14-300N-202-145 Item 12306
  • Reliable lateral contacting
  • Durable, maintenance-free precision guidance
  • Space-saving, simple, and precise installation
  • Manual actuation
Side approach mechanism SAM-H7-20-150N-020-077 Item 106220
  • Reliable lateral contacting
  • Compact, robust design
  • Durable, maintenance-free precision guidance
  • Space-saving, simple, and precise installation
  • Stroke-controlled actuation
  • Contacting process takes place at the same time as the PCB contacting
Side approach mechanism SAM-H7-16-150N-020-060-S Item 45680
  • Reliable lateral contacting
  • Compact, robust design
  • Durable, maintenance-free precision guidance
  • Space-saving, simple, and precise installation
  • Stroke-controlled actuation
  • Contacting process takes place at the same time as the PCB contacting
Side approach mechanism SAM-P-50-068N-082-105 Item 50140
  • Reliable lateral contacting
  • Durable, maintenance-free precision guidance
  • Space-saving, simple, and precise installation
  • Pneumatic actuation
Side approach mechanism SAM-M-14-300N-268-145 Item 12559
  • Reliable lateral contacting
  • Durable, maintenance-free precision guidance
  • Space-saving, simple, and precise installation
  • Manual actuation
Side approach mechanism SAM-M-20-150N-070-063 Item 41070
  • Reliable lateral contacting
  • Compact, robust design
  • Durable, maintenance-free precision guidance
  • Space-saving, simple, and precise installation
  • Manual actuation