Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT
- Vacuum test fixture with parallel closing vacuum cassette for testing large PCB quantities
- Robust, maintenance-friendly design with outstanding service life
- Available for Keysight i3070 test system
- Increased operating convenience without significant closing forces
- Single-stage and dual-stage versions
Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT
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Technical data
| Product group : | Vacuum test fixture (VA) |
|---|---|
| Main series : | VA xxxx |
| Series : | VA 20xx |
| Series : | VA 2070 |
| Size : | xx70 |
| Test fixture type : | Stand-alone test fixture |
| Contact stroke generation : | Vacuum |
| Max. interface signals : | 3666 |
| Interface blocks required : | No |
| Contacting direction : | Single-sided (bottom) |
| Max. contact force : | 11000 N |
| Approx. parallel contact stroke : | 7 mm |
| DUT position (row-column) : | 1,5/22,5 - 00/78 |
| Test system interface : | Keysight i3070-5 |
| Weight : | 12 kg |
| Min. temperature : | + 10 °C |
| Max. temperature : | + 60 °C |
| Low voltage : | No |
| ESD-compliant : | No |
| RoHS-compliant : | RoHS-3;6a;6c |
| Test probe installation height, bottom : | 16 mm |
|---|---|
| Standard version : | Yes |
| Useable area, standard (WxD) : | 305 x 380 mm |
| ESD version : | No |
| Radio frequency version : | No |
| Rigid pin version : | No |
| Dual-stage version : | No |
| Additional contacting unit (ZSK), top : | Yes, with suitable additional option |
| Outer dimensions, closed (WxDxH) : | 465 x 460 x 100 mm |
Board marker probes
Board marker probe
ME-E-R2,0-12-100-K12V
Item 24456
- Permanent marking of various materials
- Precise, adjustable positioning
- Outstanding service life, highly resistant to wear
- Very easy installation
- Electric drive system
Board marker probe
ME-E-R2,0-12-080-S12V
Item 38371
- Permanent marking of various materials
- Precise, adjustable positioning
- Outstanding service life, highly resistant to wear
- Very easy installation
- Electric drive system
Board marker probe
ME-P-F1,0-16-054-QS4
Item 29483
- Permanent marking of various materials
- Precise, adjustable positioning
- Outstanding service life, highly resistant to wear
- Very easy installation
- Pneumatic drive system
Board marker probe
ME-E-R2,0-12-060-K12V
Item 24447
- Permanent marking of various materials
- Precise, adjustable positioning
- Outstanding service life, highly resistant to wear
- Very easy installation
- Electric drive system
Board marker probe
ME-P-S2,0-16-054-QS4
Item 25241
- Permanent marking of various materials
- Precise, adjustable positioning
- Outstanding service life, highly resistant to wear
- Very easy installation
- Pneumatic drive system
Board marker probe
ME-E-S2,0-12-060-K12V
Item 25251
- Permanent marking of various materials
- Precise, adjustable positioning
- Outstanding service life, highly resistant to wear
- Very easy installation
- Electric drive system
Board marker probe
ME-E-R2,0-08-053-2S-BL6V-42V
Item 107376
- Short, compact design
- Marking tip with a new dual scratching engraver
- Precise, adjustable positioning
- Quick-exchange engraving unit
- Operating voltage from 6 V to 42 V
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
Accessories
nanoVTEP connector test
OTC-KS-NV-SP-155-013
Item 108706
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP sensor plate 1.2 inch
OTC-KS-NV-SP-031-031
Item 108704
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP sensor plate 2.5 inch
OTU-KS-NV-065-065
Item 109705
- Reliable assemblies for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
DUT support
PAS-02,8-04,0
Item 32995
- Reliable plastic stamps for supporting PCBs
- Robust, pressure-resistant, trusted design
- Uniform tip height, various tip diameters available
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
nanoVTEP single probe 0.4 inch
OTC-KS-NV-SP-010-010
Item 108703
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP amplifier
OTC-KS-NV-EP
Item 108707
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP test probe
OTC-KS-NV-GKS
Item 111606
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
Pre-centring pin
VZ-R-12-22-K-ESD
Item 23056
- Various diameters and heights available
nanoVTEP Connect Check signal C
OTE-KS-NV-064-MUX-REF
Item 108711
- Reliable electronics control units for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP signal conditioner board
OTE-KS-NV-064-MUX
Item 108710
- Reliable electronics control units for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
DUT support
PAS-05,8-03,0-FR4
Item 17806
- Reliable plastic stamps for supporting PCBs
- Robust, pressure-resistant, trusted design
- Uniform tip height, various tip diameters available
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
Pressure spring
FED-10,0-16,0-97N-09,0
Item 1571
- Trusted pressure springs, suitable for all test fixtures, exchangeable kits, and interchangeable kits
- Highest spring steel quality for maximum breakage resistance
- Various diameters available
- Various spring forces available
nanoVTEP single probe 0.16 inch
OTC-KS-NV-SP-004-004
Item 108701
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP single probe B/C Size
OTC-KS-NV-SP-007-004
Item 108702
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
DUT support
PAS-02,8-05,0
Item 3161
- Reliable plastic stamps for supporting PCBs
- Robust, pressure-resistant, trusted design
- Uniform tip height, various tip diameters available
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
nanoVTEP sensor plate 2.5 inch
OTC-KS-NV-SP-065-065
Item 108705
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScanPlus amplifier
OTC-TD-FS-EP-GKS
Item 14762
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
Opensxpress connection board
OTC-TS-OE-EP
Item 22374
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScanPlus 0.500x6.25 inch
OTC-TD-FS-SP-159-013
Item 14765
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScanPlus 1.25x1.25 inch
OTC-TD-FS-SP-032-032
Item 14766
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
nanoVTEP connector test
OTU-KS-NV-155-013
Item 109706
- Reliable assemblies for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScanPlus 0.575x0.425 inc
OTC-TD-FS-SP-013-010
Item 14763
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScanfx2.0 amplifier
OTC-TD-FX-EP
Item 26486
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
Personality pin
PP-INGUN-F
Item 45000
- Trusted personality pins for the assembly of test fixtures with Keysight test system interface
- Flat head, wire-wrap posts, entirely gold-plated
- Typical pitch distance of 3.81 mm (2.5 inches)
- Reliable over several contact cycles and corrosion resistant over many years
DUT support
PAS-02,8-03,0
Item 17990
- Reliable plastic stamps for supporting PCBs
- Robust, pressure-resistant, trusted design
- Uniform tip height, various tip diameters available
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
nanoVTEP sensor plate 1.2 inch
OTU-KS-NV-031-031
Item 109704
- Reliable assemblies for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScanPlus 2.56x2.56 inch
OTC-TD-FS-SP-065-065
Item 14767
- Reliable components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
Side approach mechanism
Side approach mechanism
SAM-M-14-300N-202-145
Item 12306
- Reliable lateral contacting
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Manual actuation
Side approach mechanism
SAM-H7-20-150N-020-077
Item 106220
- Reliable lateral contacting
- Compact, robust design
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Stroke-controlled actuation
- Contacting process takes place at the same time as the PCB contacting
Side approach mechanism
SAM-H7-16-150N-020-060-S
Item 45680
- Reliable lateral contacting
- Compact, robust design
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Stroke-controlled actuation
- Contacting process takes place at the same time as the PCB contacting
Side approach mechanism
SAM-P-50-068N-082-105
Item 50140
- Reliable lateral contacting
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Pneumatic actuation
Side approach mechanism
SAM-M-14-300N-268-145
Item 12559
- Reliable lateral contacting
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Manual actuation
Side approach mechanism
SAM-M-20-150N-070-063
Item 41070
- Reliable lateral contacting
- Compact, robust design
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Manual actuation