INGUN vaccum test fixture

test fixtures
Test large quantities reliably

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Vacuum test fixtures (VA) are used in industrial production for reliable contacting of printed circuit boards in high quantities and a low number of variants. The parallel contact stroke with a height of several millimetres is generated by means of negative pressure by suction of air into the vacuum zone. To press the test specimen onto the spring-loaded test probes, standard assemblies - so-called vacuum assemblies - are used as vacuum covers, vacuum pressure frame units, additional vacuum contacting, or vacuum drive units to provide ideally adapted assemblies for the test requirements.

The vacuum test fixtures can be used for single-stage contacting, dual-stage contacting, top contacting and customisation with vacuum-free zone, are connected to an existing test system, and have the following performance features:

  • Parallel suction vacuum cassette with established INGUN seal.
  • Robust, maintenance-friendly design with outstanding service life
  • Stand-alone system without interchangeable exchangeable kit
  • Increased ease of use thanks to simple, intuitive handling
  • Easy access to housing interior thanks to wide opening angle
  • Available in various versions and sizes
  • Available with or without test system interface
  • Service life: > 2,000,000 load cycles (under laboratory conditions)
  • Comprehensive customisation and installation documentation

Available for all common test systems and interfaces

Vacuum test fixtures are designed as stand-alone test fixtures without interchangeable exchangeable kits. They are available in different versions and sizes without and with test system interface, suitable for common test systems.

  • VPC

Please contact us in case your desired test system interface is not available. 


Modular design and simple operation

Modular design and simple operation

The vacuum cassette is equipped for the customisation of single-stage, dual-stage (combined FCT/ICT test) and top contacts as well as for testing with a vacuum-free zone. It has the established INGUN seal for the largest possible parallel stroke with increased sealing effect with increasing vacuum.

The dual-stage contacting is realised by means of an electrically operated shifting plate. The ICT test is carried out in the first stage and the FCT test in the second stage, which is approx. 5 mm above the first stage. Top contacting is realised with additional vacuum contacting in order to be able to carry out accurate contacting on both sides.