ICT & FCT
test probes Testing without compromise

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The in-circuit test (ICT) involves the measurement of all individual components of an assembly. Defective components are detected and can be replaced if necessary. The function test (FCT) checks an assembly functions 100 percent as intended. The testing environment simulates the intended field of application and the electrical behaviour of the assembly is tested.

A multitude of different test probes are available for the optimal fulfilment of the contacting task. These differ in installation height, grid size (possible distance between probes), tip style, and connection type. The electrical connection is often made via a solder cup, a wire-wrap post, as well as with or without cable. INGUN offers various test probes depending on the assembly (PCB) to be contacted and the ambient conditions.

  1. Function test
  2. In-circuit test
  1. Standard stroke - Standard PIN and PAD contacting
  2. Long stroke - Dual-stage contacting
  3. Wireless - Connection without cable
  4. Short test probe - Limited space
  5. INGUN E-Type - Contacting contaminated surfaces
  1. Function test
  2. In-circuit test
  1. Rotating probe - Contacting contaminated surfaces
  2. Bead probe - Contacting beads on printed circuit board (PCB)
  3. Fine pitch - Small grid size
  4. Metric standard - Robust test probes (GKS) for harsh conditions
Test Probe GKS-075 303 120 A 2800 Item GKS-075-0170
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-075 291 064 A 2000 Item E-075-0001
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Spring-loaded test probe GKS-100 360 090 A 2000 Item GKS-100-1073
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-001 305 100 A 1000 Item GKS-001-0005
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Test Probe GKS-050 291 050 A 1000 Item GKS-050-0012
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-912 303 200 A 1502 Item GKS-912-0490
  • Robust test probes with distinctive collar (stop) on the barrel
  • Optimum adjustment of the stroke ratios in the test fixture: The collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
  • Version with central beading ensure low wobble for contacting small test points
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Test Probe GKS-035 291 064 A 1200 Item GKS-035-0004
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles