nanoVTEP Connect Check signal C OTE-KS-NV-064-MUX-REF Item 108711

New
  • Reliable electronics control units for the opens test for capacitive testing of semiconductor chips for short circuits and solder faults
  • Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
  • Quick, easy installation
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nanoVTEP Connect Check signal C OTE-KS-NV-064-MUX-REF Item 108711

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Downloads
Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_108711.STEP)
Product datasheet (EN|pdf)
Choose version
OTE-KS-NV-064-MUX-REF (108711)
OTE-SP-ES-016-MUX (32627) OTE-TD-FX-064-MUX-SET (31738) OTE-KS-NV-064-MUX (108710) OTE-KS-NV-064-MUX-REF (108711) OTE-TD-FX-064-MUX (31737) OTE-TS-OE-032-OFM (22373)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Opens tests
Series : OTE
Type : Keysight
Version : nanoVTEP Connect Check signal C
Accessory type : Customising accessory
Width : 35.8 mm
Height : 17.4 mm
RoHS-compliant : RoHS-3
Technical data
Installation : Thread M3
Number of poles : 2x 64
Length : 230 mm
Outer dimensionS (WxDxH) : 230.0 x 35.8 x 17.4 mm
Compatible with
Vacuum test fixtures (VA) : VA 2070
Interchangeable kits (WS) : WS Keysight/i3070-5i

Vacuum test fixtures

INGUN SELECTION VA 2070S/i3070-5
Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT
  • Vacuum test fixture with parallel closing vacuum cassette for testing large PCB quantities
  • Robust, maintenance-friendly design with outstanding service life
  • Available for Keysight i3070 test system
  • Increased operating convenience without significant closing forces
  • Single-stage and dual-stage versions
  • Single-stage and dual-stage versions
  • Detailed accompanying documents (e.g., customising guidelines)
Product details