Personality pin PP-INGUN-F Item 45000

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  • Trusted personality pins for the assembly of test fixtures with Keysight test system interface
  • Flat head, wire-wrap posts, entirely gold-plated
  • Typical pitch distance of 3.81 mm (2.5 inches)
  • Reliable over several contact cycles and corrosion resistant over many years
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Personality pin PP-INGUN-F Item 45000

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Downloads
Conformation of RoHS compliance (EN|PDF)
Document (45000__Kundenzeichnung.PDF)
CAD file (INGUN_45000.STEP)
Product datasheet (EN|pdf)
Choose version
PP-INGUN-F (45000)
PP-INGUN-F (45000)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Personality pins
Series : PP
Type : Personality pin
Version : Tip style flat
Accessory type : Customising accessories
Weight : 0.01 kg
Min. temperature : + 10 °C
Max. temperature : + 60 °C
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 2.23 - 2.25 mm
Mounting hole in FR4 : 2.23 - 2.25 mm
Technical data
Connection : Wire-wrap posts (gold-plated)
Tip diameter : 2.3 mm
Installation : Pressed in
Installation grid : 3.81 mm
Length : 48.6 mm
Diameter : 3.0 mm
Compatible with
Exchangeable kits version : No limitations
Vacuum test fixtures (VA) : VA 2070, VA 3070

Vacuum test fixtures

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INGUN SELECTION VA 2070S/i3070-5
Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT
  • Vacuum test fixture with parallel closing vacuum cassette for testing large PCB quantities
  • Robust, maintenance-friendly design with outstanding service life
  • Available for Keysight i3070 test system
  • Increased ease of use without significant closing forces
  • Single-stage and dual-stage versions
  • Single-stage and dual-stage versions
  • Detailed accompanying documents (e.g., customising guidelines)
Product details
VA 2073L/i3070-5
Vacuum test fixture VA 2073L/i3070-5 Item 8326
  • Vacuum test fixture with parallel closing vacuum cassette for testing large PCB quantities
  • Robust, maintenance-friendly design with outstanding service life
  • Stand-alone test fixtures with pre-configured test system interface
  • Available for Keysight i3070 test system
  • Increased ease of use without significant closing forces
  • Single-stage and dual-stage versions
  • Detailed accompanying documents (e.g., customising guidelines)
Product details