Ingun E-Type test probe E-075 238 064 E 2000 Item E-075-0076
- Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
- When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Ingun E-Type test probe E-075 238 064 E 2000 Item E-075-0076
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Technical data
Product group : | ICT / FCT (in-circuit test and function test |
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Sub-product group : | INGUN E-TYPE® |
Series : | E-075 |
Grid : | 1.91 mm |
Contacting from : | Pad, via |
Magnetic : | Yes |
Installation type : | Plug-in |
Quick-exchange system : | Yes |
Adjustable installation height : | No |
Non-rotating : | No |
Compatible receptacle(s) : | KS-075 |
Min. temperature : | - 40 °C |
Max. temperature : | + 80 °C |
RoHS-compliant : | RoHS-3;6a |
Current load capacity / rated current : | 3 A |
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Typical resistance (Ri) : | < 20 mOhm |
Total length : | 33.1 mm |
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Barrel diameter : | 1.02 mm |
Maximum stroke : | 6.35 mm |
Spring pre-load : | 1.11 N |
Collar height : | 00 |
Spring force at working stroke : | 2 N |
Working stroke : | 4.3 mm |
Tip style : | 38 150° passive dagger, self-cleaning |
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Tip diameter : | 0.64 mm |
Tip style surface : | E palladium / nickel |
Tip style material : | 2 steel |