Receptacle KS-075 30 G Item KS-07530G
Receptacle KS-075 30 G Item KS-07530G
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-075 |
| Sub-series : | KS-075 press-in version |
| Type of receptacle connection : | Solder |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 1.47 mm |
| Collar height : | 7.6 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 1.30 - 1.32 mm |
|---|---|
| Mounting hole in FR4 : | 1.31 - 1.33 mm |
| Mounting hole with press ring in CEM1 : | 1.39 - 1.40 mm |
| Mounting hole with press ring in FR4 : | 1.39 - 1.40 mm |
| Total length : | 30 mm |
|---|---|
| Outer diameter : | 1.32 mm |
Test probes for installation height, Test probes 21.00 mm
Spring-loaded test probe
GKS-075 297 064 A 2000 E
Item GKS-075-1047
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Test probes for installation height, Test probes
Spring-loaded test probe
GKS-075 E
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-075 LP
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-075 LH
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-035
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-075
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE®
E-075
- Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
- When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Receptacles
