KS with solder cup, inst. height 10.5mm KS-075 30 E03 Item KS-07530E03

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Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KS-075_30_E03.STEP)
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KS-075 30 E03 (KS-07530E03) INGUN SELECTION
KS-075 30 G (KS-07530G) INGUN SELECTION KS-075 35 G (KS-07535G) INGUN SELECTION KS-075 44 G (KS-07544G) INGUN SELECTION KS-075 47 G 10 (KS-07547G10) INGUN SELECTION KS-075 30 E03 (KS-07530E03) INGUN SELECTION KS-075 47 E03 (KS-07547E03) INGUN SELECTION KS-075 30 E05 (KS-07530E05) INGUN SELECTION KS-075 47 E05 (KS-07547E05) INGUN SELECTION KS-075 47 G (KS-07547G) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-075
Sub-series : KS-075 press-in version
Type of receptacle connection : Solder
Press ring : Yes
Surface area : Gold
Collar diameter : 1.47 mm
Collar height : 2 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 1.30 - 1.32 mm
Mounting hole in FR4 : 1.31 - 1.33 mm
Mounting hole with press ring in CEM1 : 1.39 - 1.40 mm
Mounting hole with press ring in FR4 : 1.39 - 1.40 mm
Mechanical data
Total length : 30 mm
Outer diameter : 1.32 mm

Test probes for installation height, Test probes 15.50 mm

Spring-loaded test probe GKS-075 297 064 A 2000 E Item GKS-075-1047
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles

Test probes for installation height, Test probes

Spring-loaded test probe GKS-075
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version GKS-075 LP
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-035
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE® E-075
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Spring-loaded test probe, long version GKS-075 LH
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-075 E
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles