Insertion and extraction tools SW-ZW-WP-075 A Item SW-ZW-WP-075A
Insertion and extraction tools SW-ZW-WP-075 A Item SW-ZW-WP-075A
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Technical data
| Product group : | Insertion and extraction tools (SW-ZW) |
|---|---|
| Compatible test probe(s) / receptacle(s) : | 112 E-075, GKS-075 |
| Series : | SW-GKS |
| Tool for receptacle (KS) : | No |
| Tool for test probe (GKS) : | Yes |
| Test probe installation type : | Plug-in |
| Max. tip diameter : | 0.64 mm |
| Tool version : | Rigid |
| RoHS-compliant : | - |
Test probes
Spring-loaded test probe, long version
GKS-075 LH
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-075 E
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE®
E-075
- Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
- When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Spring-loaded test probe
GKS-075 297 064 A 2000 E
Item GKS-075-1047
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-075 LP
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-075
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles