Spring-loaded test probe

Spring-loaded test probes (GKS) are used for contacting and testing of electronic components and assemblies and usually consist of a plunger, a spring, and a barrel. All spring-loaded test probes have a similar functional principle with a spring-loaded plunger and recommended working stroke. Depending on the electronic assembly and the test points to be contacted, different plunger tip styles are available. By combining the optimally selected version and spring force, precise, safe and replicable contacting can be achieved. Tip styles for pads, VIAs, pins, posts and plug connectors are available.

INGUN offers an unsurpassed variety of spring-loaded test probes. The part number is structured according to a defined naming key and contains relevant information about the tip style, diameter, spring force and materials. Various materials are used for the optimum performance of the testing tasks.

The materials used to produce INGUN test probes fulfil all relevant environmental regulations