Connector contacting is used for reliable, low-wear contacting of connectors on electronic assemblies.
Flat connectors or sockets which may only be contacted in one position, are tested using test probes that are secured against rotation. Only in this way can non-destructive testing be carried out. These probes are already mounted in the correct position during assembly. Non-rotating test probes are designed so that theplunger is guided and rotation is not possible. If the connectors to be tested are radio frequency connectors (e.g. FAKRA, HSD, USB or RJ connectors), they must also be tested with radio frequency test probes.