Test probe, INGUN S-Line S-050 306 115 A 1200 L Item S-050-0006

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Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_S-050_306_115_A_xx00_L.STEP)
Product datasheet (EN|pdf)
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S-050 306 115 A 1200 L (S-050-0006)
S-050 207 115 A 1200 L (S-050-0003) S-050 214 115 A 1200 L (S-050-0004) S-050 306 115 A 1200 L (S-050-0006) S-050 291 064 A 1200 L (S-050-0001) S-050 297 064 A 1200 L (S-050-0005)
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Technical data
General data
Product group : ICT / FCT (in-circuit test and function test
Sub-product group : INGUN S-Line
Series : S-050 L long version
Grid : 1.27 mm
Contacting from : Pin, Post, Flat contact
Magnetic : Yes
Installation type : Plug-in
Quick-exchange system : Yes
Type of test probe connection : Contact terminal
Adjustable installation height : No
Non-rotating : No
Min. temperature : - 40 °C
Max. temperature : + 80 °C
RoHS-compliant : RoHS-3;6c
Electrical data
Current load capacity / rated current : 4 A
Typical resistance (Ri) : < 20 mOhm
Mechanical data
Total length : 39.62 mm
Barrel diameter : 1.02 mm
Maximum stroke : 10 mm
Spring pre-load : 0.21 N
Collar height : 00
Working stroke : 8 mm
Mounting hole in probe plate (KTP) : 1.07 - 1.09 mm
Mounting hole in S-Line spacer plate (SDP) : min. 1.14 mm
KT designation : KT-S050
Wireless receptacle data
Spring force at working stroke : 1.2 N
Tip style data
Tip style : 06 serrated
Tip diameter : 1.15 mm
Tip style surface : A gold
Tip style material : 3 CuBe

Contact terminals

Contact terminal A KT-S-050 47 35 Item KT-S050-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-050 67 24 Item KT-S050-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-050 67 23 Item KT-S050-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels