Contact terminal KT-S-050 67 24 Item KT-S050-0003
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Contact terminal KT-S-050 67 24 Item KT-S050-0003
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Shipping costs
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Technical data
| Product group : | Contact terminals (KT) |
|---|---|
| Series : | KT-S050 |
| Sub-series : | KT-S050 standard |
| Grid : | 1.27 mm |
| Type of contact terminal connection : | Wireless |
| Magnetic : | Yes |
| Installation type : | Press-in |
| Quick-exchange system : | No |
| Surface area : | A gold |
| Knurl : | No |
| RoHS-compliant : | RoHS-3;6c |
| Mounting hole in CEM1 : | 0.97 - 0.99 mm |
|---|---|
| Mounting hole in FR4 : | 0.97 - 0.99 mm |
| Total length : | 24.34 mm |
|---|---|
| Shaft diameter : | 0.9 mm |
| Latching lug : | No |
| Tip diameter : | 0.64 mm |
|---|
Test probes
Test probe, INGUN S-Line
S-075 277 090 A 2200 ES
Item S-075-0042
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 2200 S
Item S-075-0054
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 214 050 A 1500 S
Item S-050-0014
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 150 A 1500 S
Item S-075-0029
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 1000 S
Item S-075-0059
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 1500 L
Item S-075-0004
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 238 064 A 0800 S
Item S-050-0032
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 289 050 A 1500 S
Item S-075-0026
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 130 A 1500 L
Item S-075-0009
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 130 A 2200 ES
Item S-075-0039
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 120 A 2200 ES
Item S-050-0024
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 319 180 A 1500 S
Item S-075-0035
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 050 A 1500 S
Item S-075-0016
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 100 A 2000 S
Item S-050-0036
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 3000 S
Item S-075-0002
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 2000 L
Item S-075-0055
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 050 A 2200 ES
Item S-075-0038
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 150 A 1500 L
Item S-075-0010
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 291 064 A 2000 S
Item S-050-0002
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 150 A 1500 S
Item S-075-0025
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 204 090 A 1500 S
Item S-075-0013
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 277 064 A 2200 ES
Item S-050-0028
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 150 A 1500 L
Item S-075-0008
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 238 064 A 1500 S
Item S-050-0012
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 204 150 A 1500 S
Item S-075-0014
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 291 064 A 1500 S
Item S-050-0007
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 100 A 1500 S
Item S-050-0016
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 314 130 A 1500 S
Item S-075-0034
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 314 130 A 2200 ES
Item S-075-0048
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 1500 S
Item S-075-0021
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 170 A 1500 S
Item S-075-0033
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 297 064 A 2000 S
Item S-050-0037
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 1500 L
Item S-075-0003
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 100 A 2200 ES
Item S-050-0023
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 150 A 2200 ES
Item S-075-0046
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 1500 S
Item S-075-0011
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 214 100 A 1500 S
Item S-050-0015
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 297 064 A 1500 S
Item S-050-0008
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 209 060 A 1500 S
Item S-075-0015
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 302 150 A 1500 S
Item S-075-0022
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 130 A 1500 S
Item S-075-0024
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 225 130 A 1500 S
Item S-075-0018
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 090 A 1500 S
Item S-075-0031
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 130 A 2000 L
Item S-075-0058
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 306 115 A 1200 L
Item S-050-0006
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 217 170 A 1500 S
Item S-075-0017
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 214 050 A 2200 ES
Item S-050-0025
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 225 130 A 2000 S
Item S-075-0056
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 2200 ES
Item S-075-0043
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 201 064 A 1500 S
Item S-050-0011
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 297 064 A 2200 ES
Item S-050-0030
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 170 A 2200 ES
Item S-075-0047
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 200 A 1500 S
Item S-075-0030
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 201 090 A 2200 ES
Item S-075-0036
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 238 064 A 2200 ES
Item S-050-0027
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 2200 ES
Item S-075-0044
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 305 064 A 2800 S
Item S-050-0034
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 130 A 1500 L
Item S-075-0006
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 064 A 2200 ES
Item S-050-0022
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 303 150 A 1500 S
Item S-075-0023
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 303 120 A 1500 S
Item S-050-0019
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 115 A 1200 L
Item S-050-0003
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 201 090 A 1500 S
Item S-075-0012
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 238 090 A 1500 L
Item S-075-0005
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 297 064 A 0800 S
Item S-050-0035
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 214 115 A 1200 L
Item S-050-0004
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 305 090 A 1500 S
Item S-075-0027
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 050 A 2000 S
Item S-075-0051
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 150 A 1500 S
Item S-075-0032
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 297 064 A 1200 L
Item S-050-0005
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 297 064 A 2200 S
Item S-050-0033
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 305 064 A 1500 S
Item S-050-0013
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 306 120 A 1500 S
Item S-050-0018
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 2000 L
Item S-075-0001
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 297 090 A 2000 S
Item S-075-0053
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 291 064 A 2200 ES
Item S-050-0029
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 130 A 1500 S
Item S-075-0028
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 277 090 A 1500 S
Item S-075-0020
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 238 090 A 2200 ES
Item S-075-0041
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 130 A 1500 L
Item S-075-0007
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 120 A 1500 S
Item S-050-0020
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 214 100 A 2200 ES
Item S-050-0026
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 2000 S
Item S-075-0052
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 201 064 A 2200 ES
Item S-050-0021
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 209 060 A 2200 ES
Item S-075-0037
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 277 064 A 1500 S
Item S-050-0009
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 306 100 A 1500 S
Item S-050-0017
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 207 064 A 1500 S
Item S-050-0010
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 1000 S
Item S-075-0057
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 214 150 A 2200 ES
Item S-075-0040
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 307 090 A 2200 ES
Item S-075-0045
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 238 090 A 1500 S
Item S-075-0019
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-050 291 064 A 1200 L
Item S-050-0001
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems