Contact terminal KT-S-050 67 24 Item KT-S050-0003

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CAD file (INGUN_KT-S-050_67_24.STEP)
Product datasheet (EN|pdf)
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KT-S-050 67 24 (KT-S050-0003)
KT-S-050 67 23 (KT-S050-0002) KT-S-050 47 35 (KT-S050-0001) KT-S-050 67 24 (KT-S050-0003)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Contact terminals (KT)
Series : KT-S050
Sub-series : KT-S050 standard
Grid : 1.27 mm
Type of contact terminal connection : Wireless
Magnetic : Yes
Installation type : Press-in
Quick-exchange system : No
Surface area : A gold
Knurl : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 0.97 - 0.99 mm
Mounting hole in FR4 : 0.97 - 0.99 mm
Mechanical data
Total length : 24.34 mm
Shaft diameter : 0.9 mm
Latching lug : No
Tip style data
Tip diameter : 0.64 mm

Test probes

Test probe, INGUN S-Line S-075 277 090 A 2200 ES Item S-075-0042
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2200 S Item S-075-0054
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 214 050 A 1500 S Item S-050-0014
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 150 A 1500 S Item S-075-0029
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 1000 S Item S-075-0059
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 1500 L Item S-075-0004
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 238 064 A 0800 S Item S-050-0032
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 289 050 A 1500 S Item S-075-0026
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 130 A 1500 L Item S-075-0009
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 130 A 2200 ES Item S-075-0039
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 120 A 2200 ES Item S-050-0024
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 319 180 A 1500 S Item S-075-0035
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 050 A 1500 S Item S-075-0016
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 100 A 2000 S Item S-050-0036
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 3000 S Item S-075-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2000 L Item S-075-0055
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 050 A 2200 ES Item S-075-0038
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 150 A 1500 L Item S-075-0010
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 291 064 A 2000 S Item S-050-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 150 A 1500 S Item S-075-0025
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 204 090 A 1500 S Item S-075-0013
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 277 064 A 2200 ES Item S-050-0028
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 150 A 1500 L Item S-075-0008
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 238 064 A 1500 S Item S-050-0012
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 204 150 A 1500 S Item S-075-0014
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 291 064 A 1500 S Item S-050-0007
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 100 A 1500 S Item S-050-0016
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 314 130 A 1500 S Item S-075-0034
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 314 130 A 2200 ES Item S-075-0048
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 1500 S Item S-075-0021
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 170 A 1500 S Item S-075-0033
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 297 064 A 2000 S Item S-050-0037
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 1500 L Item S-075-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 100 A 2200 ES Item S-050-0023
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 150 A 2200 ES Item S-075-0046
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 1500 S Item S-075-0011
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 214 100 A 1500 S Item S-050-0015
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 297 064 A 1500 S Item S-050-0008
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 209 060 A 1500 S Item S-075-0015
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 302 150 A 1500 S Item S-075-0022
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 130 A 1500 S Item S-075-0024
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 225 130 A 1500 S Item S-075-0018
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 090 A 1500 S Item S-075-0031
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 130 A 2000 L Item S-075-0058
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 306 115 A 1200 L Item S-050-0006
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 217 170 A 1500 S Item S-075-0017
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 214 050 A 2200 ES Item S-050-0025
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 225 130 A 2000 S Item S-075-0056
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 2200 ES Item S-075-0043
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 201 064 A 1500 S Item S-050-0011
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 297 064 A 2200 ES Item S-050-0030
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 170 A 2200 ES Item S-075-0047
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 200 A 1500 S Item S-075-0030
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 201 090 A 2200 ES Item S-075-0036
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 238 064 A 2200 ES Item S-050-0027
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2200 ES Item S-075-0044
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 305 064 A 2800 S Item S-050-0034
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 130 A 1500 L Item S-075-0006
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 064 A 2200 ES Item S-050-0022
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 303 150 A 1500 S Item S-075-0023
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 303 120 A 1500 S Item S-050-0019
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 115 A 1200 L Item S-050-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 201 090 A 1500 S Item S-075-0012
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 238 090 A 1500 L Item S-075-0005
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 297 064 A 0800 S Item S-050-0035
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 214 115 A 1200 L Item S-050-0004
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 305 090 A 1500 S Item S-075-0027
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 050 A 2000 S Item S-075-0051
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 150 A 1500 S Item S-075-0032
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 297 064 A 1200 L Item S-050-0005
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 297 064 A 2200 S Item S-050-0033
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 305 064 A 1500 S Item S-050-0013
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 306 120 A 1500 S Item S-050-0018
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 2000 L Item S-075-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2000 S Item S-075-0053
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 291 064 A 2200 ES Item S-050-0029
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 130 A 1500 S Item S-075-0028
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 277 090 A 1500 S Item S-075-0020
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 238 090 A 2200 ES Item S-075-0041
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 130 A 1500 L Item S-075-0007
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 120 A 1500 S Item S-050-0020
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 214 100 A 2200 ES Item S-050-0026
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 2000 S Item S-075-0052
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 201 064 A 2200 ES Item S-050-0021
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 209 060 A 2200 ES Item S-075-0037
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 277 064 A 1500 S Item S-050-0009
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 306 100 A 1500 S Item S-050-0017
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 207 064 A 1500 S Item S-050-0010
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 1000 S Item S-075-0057
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 150 A 2200 ES Item S-075-0040
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 090 A 2200 ES Item S-075-0045
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 238 090 A 1500 S Item S-075-0019
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-050 291 064 A 1200 L Item S-050-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems