Receptacle KS-967 70 Item KS-96770
Receptacle KS-967 70 Item KS-96770
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Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-967 |
| Sub-series : | KS-967 press-in version |
| Type of receptacle connection : | Solder outer surface |
| Press ring : | No |
| Surface area : | Gold |
| Collar diameter : | 2.3 mm |
| Collar height : | 5 mm |
| Knurl : | No |
| Vacuum-tight : | yes (< 1 ccm / min) |
| RoHS-compliant : | RoHS-3;6c |
| Mounting hole in CEM1 : | 0.65 mm |
|---|---|
| Mounting hole in FR4 : | 0.65 mm |
| Total length : | 7 mm |
|---|---|
| Outer diameter : | 2.3 mm |
Test probes for installation height, Test probes 9.20 mm
Spring-loaded test probe
GKS-967 215 130 A 2001 G
Item GKS-967-0082
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 215 130 A 1001
Item GKS-967-0026
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 215 130 A 2001
Item GKS-967-0001
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 215 130 A 2001 C
Item GKS-967-0086
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Test probes for installation height, Test probes 7.60 mm
Spring-loaded test probe
GKS-967 306 130 A 1001 C
Item GKS-967-0059
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 304 130 A 1001
Item GKS-967-0007
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 303 130 A 1001 G
Item GKS-967-0208
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 303 130 A 2001 G
Item GKS-967-0073
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 303 130 A 2001
Item GKS-967-0023
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 306 130 A 1001 G
Item GKS-967-0093
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Test Probe
GKS-967 303 130 A 1001
Item GKS-967-0011
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 304 130 A 2001
Item GKS-967-0003
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 302 130 A 1001 G
Item GKS-967-0088
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 305 130 A 1001
Item GKS-967-0008
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 304 130 A 1001 C
Item GKS-967-0038
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 305 130 A 2001 G
Item GKS-967-0041
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 302 130 A 2001
Item GKS-967-0002
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 302 130 A 1001
Item GKS-967-0010
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 302 130 A 2001 G
Item GKS-967-0074
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 305 130 A 1001 G
Item GKS-967-0030
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 302 130 A 2001 C
Item GKS-967-0043
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 304 130 A 2001 C
Item GKS-967-0053
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 306 130 A 2001 C
Item GKS-967-0070
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 306 130 A 1001
Item GKS-967-0020
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 304 130 A 2001 G
Item GKS-967-0065
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 305 130 A 2001
Item GKS-967-0006
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 302 130 A 1001 C
Item GKS-967-0045
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 304 130 A 1001 G
Item GKS-967-0036
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
Spring-loaded test probe
GKS-967 305 130 A 1001 C
Item GKS-967-0039
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 306 130 A 2001
Item GKS-967-0015
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 305 130 A 2001 C
Item GKS-967-0042
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 303 130 A 2001 C
Item GKS-967-0051
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
- Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe
GKS-967 306 130 A 2001 G
Item GKS-967-0060
- Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
- For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
- Particularly suitable for use in applications where space for overall length is limited
- Compensation of possible height and component tolerances
