Receptacle KS-967 70 Item KS-96770

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KS-967 70 (KS-96770) INGUN SELECTION
KS-967 70 (KS-96770) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-967
Sub-series : KS-967 press-in version
Type of receptacle connection : Solder outer surface
Press ring : No
Surface area : Gold
Collar diameter : 2.3 mm
Collar height : 5 mm
Knurl : No
Vacuum-tight : yes (< 1 ccm / min)
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 0.65 mm
Mounting hole in FR4 : 0.65 mm
Mechanical data
Total length : 7 mm
Outer diameter : 2.3 mm

Test probes for installation height, Test probes 9.20 mm

Spring-loaded test probe GKS-967 215 130 A 2001 G Item GKS-967-0082
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Spring-loaded test probe GKS-967 215 130 A 1001 Item GKS-967-0026
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 2001 Item GKS-967-0001
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 2001 C Item GKS-967-0086
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available

Test probes for installation height, Test probes 7.60 mm

Spring-loaded test probe GKS-967 306 130 A 1001 C Item GKS-967-0059
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 1001 Item GKS-967-0007
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 1001 G Item GKS-967-0208
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Spring-loaded test probe GKS-967 303 130 A 2001 G Item GKS-967-0073
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 2001 Item GKS-967-0023
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 1001 G Item GKS-967-0093
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Test Probe GKS-967 303 130 A 1001 Item GKS-967-0011
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 Item GKS-967-0003
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 1001 G Item GKS-967-0088
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
INGUN SELECTION GKS-967 305 130 A 1001
Spring-loaded test probe GKS-967 305 130 A 1001 Item GKS-967-0008
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 1001 C Item GKS-967-0038
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 2001 G Item GKS-967-0041
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Spring-loaded test probe GKS-967 302 130 A 2001 Item GKS-967-0002
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 1001 Item GKS-967-0010
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 2001 G Item GKS-967-0074
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Spring-loaded test probe GKS-967 305 130 A 1001 G Item GKS-967-0030
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Spring-loaded test probe GKS-967 302 130 A 2001 C Item GKS-967-0043
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 C Item GKS-967-0053
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 2001 C Item GKS-967-0070
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 1001 Item GKS-967-0020
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 G Item GKS-967-0065
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
INGUN SELECTION GKS-967 305 130 A 2001
Spring-loaded test probe GKS-967 305 130 A 2001 Item GKS-967-0006
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 1001 C Item GKS-967-0045
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 1001 G Item GKS-967-0036
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
Spring-loaded test probe GKS-967 305 130 A 1001 C Item GKS-967-0039
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 2001 Item GKS-967-0015
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 2001 C Item GKS-967-0042
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 2001 C Item GKS-967-0051
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 2001 G Item GKS-967-0060
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances