Receptacle KS-003 30 G Item KS-00330G
Receptacle KS-003 30 G Item KS-00330G
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Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-003 |
| Sub-series : | KS-003 press-in version |
| Type of receptacle connection : | Solder |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 2.49 mm |
| Collar height : | 7.6 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 2.33 - 2.34 mm |
|---|---|
| Mounting hole in FR4 : | 2.33 - 2.34 mm |
| Mounting hole with press ring in CEM1 : | 2.39 - 2.44 mm |
| Mounting hole with press ring in FR4 : | 2.39 - 2.44 mm |
| Total length : | 30.2 mm |
|---|---|
| Outer diameter : | 2.36 mm |
Test probes for installation height, Test probes 16.00 mm
Spring-loaded test probe
GKS-003 201 127 A 3000
Item GKS-003-0021
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 307 300 A 3000
Item GKS-003-0032
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION
Spring-loaded test probe
GKS-003 206 254 A 3000
Item GKS-003-0019
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 170 A 2000
Item GKS-003-0040
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 170 A 1200
Item GKS-003-0034
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 305 254 S 2000
Item HSS-003-0005
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 307 254 A 2000
Item GKS-003-0030
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 305 254 S 3000
Item HSS-003-0001
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 305 127 A 1200
Item GKS-003-0008
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 206 254 A 1200
Item GKS-003-0003
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 317 254 A 3000
Item HSS-003-0004
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 302 127 A 2000
Item GKS-003-0015
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 308 254 A 3000
Item GKS-003-0042
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 317 254 A 2000
Item HSS-003-0008
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 307 300 A 1200
Item GKS-003-0048
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 308 254 A 2000
Item GKS-003-0035
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 302 100 A 1200
Item GKS-003-0041
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 319 254 A 3000
Item HSS-003-0003
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 201 127 A 1200
Item GKS-003-0001
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 307 300 A 2000
Item GKS-003-0027
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 204 254 A 3000
Item GKS-003-0038
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 204 254 A 1200
Item GKS-003-0026
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION
Spring-loaded test probe
GKS-003 303 254 A 2000
Item GKS-003-0006
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 307 254 A 3000
Item GKS-003-0033
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 303 254 A 1200
Item GKS-003-0005
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 307 254 A 1200
Item GKS-003-0028
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION
Spring-loaded test probe
GKS-003 204 254 A 2000
Item GKS-003-0031
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 254 A 3000
Item GKS-003-0039
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 302 127 A 1200
Item GKS-003-0022
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 306 254 A 2000
Item HSS-003-0006
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 302 127 A 3000
Item GKS-003-0023
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 319 254 A 2000
Item HSS-003-0007
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 305 170 A 3000
Item GKS-003-0043
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION
Spring-loaded test probe
GKS-003 206 254 A 2000
Item GKS-003-0004
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-003 306 254 A 3000
Item HSS-003-0002
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-003 308 254 A 1200
Item GKS-003-0029
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 127 A 2000
Item GKS-003-0007
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 127 A 3000
Item GKS-003-0020
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 254 A 1200
Item GKS-003-0037
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 302 100 A 3000
Item GKS-003-0047
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 201 127 A 2000
Item GKS-003-0002
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 302 100 A 2000
Item GKS-003-0016
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 305 254 A 2000
Item GKS-003-0036
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-003 303 254 A 3000
Item GKS-003-0011
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
