Test probe, INGUN S-Line S-039 291 050 A 1300 L Item S-039-0001

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Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_S-039_291_050_A_xx00_L.STEP)
Product datasheet (EN|pdf)
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S-039 291 050 A 1300 L (S-039-0001)
S-039 297 050 A 1300 L (S-039-0017) S-039 291 050 A 1300 L (S-039-0001) S-039 277 050 A 1300 L (S-039-0018) S-039 307 050 A 1300 L (S-039-0019) S-039 297 050 A 2000 L (S-039-0025)
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Technical data
General data
Product group : ICT / FCT (in-circuit test and function test
Sub-product group : INGUN S-Line
Series : S-039 L long version
Grid : 1 mm
Contacting from : Pad, via
Magnetic : Yes
Installation type : Plug-in
Quick-exchange system : Yes
Type of test probe connection : Contact terminal
Adjustable installation height : No
Non-rotating : No
Min. temperature : - 40 °C
Max. temperature : + 80 °C
RoHS-compliant : RoHS-3;6a
Electrical data
Current load capacity / rated current : 2 A
Typical resistance (Ri) : < 30 mOhm
Mechanical data
Total length : 41.02 mm
Barrel diameter : 0.78 mm
Maximum stroke : 10 mm
Spring pre-load : 0.14 N
Collar height : 00
Spring force at working stroke : 1.3 N
Working stroke : 8 mm
Mounting hole in probe plate (KTP) : 0.80 - 0.82 mm
Mounting hole in S-Line spacer plate (SDP) : min. 0.86 mm
KT designation : KT-S039
Tip style data
Tip style : 91 dagger, self-cleaning
Tip diameter : 0.5 mm
Tip style surface : A gold
Tip style material : 2 steel

Contact terminals

Contact terminal KT-S-039 67 22 Item KT-S039-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-039 67 21 Item KT-S039-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal A KT-S-039 57 27 Item KT-S039-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels