Test probe, INGUN S-Line S-039 238 050 A 2200 ES Item S-039-0004

New
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
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Test probe, INGUN S-Line S-039 238 050 A 2200 ES Item S-039-0004

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Downloads
Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_S-039_238_050_A_xx00_ES.STEP)
Choose version
S-039 238 050 A 2200 ES (S-039-0004)
S-039 238 050 A 2200 ES (S-039-0004) S-039 214 028 A 2200 ES (S-039-0007) S-039 277 050 A 2200 ES (S-039-0011) S-039 297 050 A 2200 ES (S-039-0013) S-039 291 050 A 2200 ES (S-039-0005) S-039 201 050 A 2200 ES (S-039-0015) S-039 214 050 A 2200 ES (S-039-0009)
Here you can optionally configure a new variant:
Technical data
General data
Product group : ICT / FCT (in-circuit test and function test
Sub-product group : INGUN S-Line
Series : S-039 ES standard with increased spring pre-load
Grid : 1 mm
Contacting from : Pad, via
Magnetic : Yes
Installation type : Plug-in
Quick-exchange system : Yes
Type of test probe connection : Contact terminal
Adjustable installation height : No
Non-rotating : No
Min. temperature : - 40 °C
Max. temperature : + 80 °C
RoHS-compliant : RoHS-3;6a
Electrical data
Current load capacity / rated current : 2 A
Typical resistance (Ri) : < 30 mOhm
Mechanical data
Total length : 36.83 mm
Barrel diameter : 0.78 mm
Maximum stroke : 6.35 mm
Spring pre-load : 1 N
Collar height : 00
Working stroke : 4.3 mm
Mounting hole in probe plate (KTP) : 0.80 - 0.82 mm
Mounting hole in S-Line spacer plate (SDP) : min. 0.86 mm
KT designation : KT-S039
Wireless receptacle data
Spring force at working stroke : 2.25 N
Tip style data
Tip style : 38 150° passive dagger, self-cleaning
Tip diameter : 0.5 mm
Tip style surface : A gold
Tip style material : 2 steel

Contact terminals

KT-S-039 67 21
Contact terminal KT-S-039 67 21 Item KT-S039-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Product details
KT-S-039 67 22
Contact terminal KT-S-039 67 22 Item KT-S039-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Product details
KT-S-039 57 27
Contact terminal A KT-S-039 57 27 Item KT-S039-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Product details