NanoVTEP G2 SingleProbe B/C OTU-KS-NV-007-004-G2 Item 114388

  • Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
  • Suitable for all Keysight 307x test systems with software version 9.2 or higher
  • Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
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NanoVTEP G2 SingleProbe B/C OTU-KS-NV-007-004-G2 Item 114388

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Downloads
Conformation of RoHS compliance (EN|PDF)
Document (114388__Kundenzeichnung.PDF)
CAD file (INGUN_114388.STEP)
Document (INFO_4250.PDF)
Document (Keysight-nanoVTEP_XReferenz_DE_EN_2.0.pdf)
Product datasheet (EN|pdf)
Choose version
OTU-KS-NV-007-004-G2 (114388)
OTU-KS-NV-155-013 (109706) OTU-KS-NV-010-010-G2 (114386) OTU-KS-NV-004-004-G2 (114387) OTU-KS-NV-031-031 (109704) OTU-SP-ES-028-028-L300 (32630) OTU-KS-NV-007-004-G2 (114388) OTU-KS-NV-065-065 (109705) OTU-TD-FX-CS-008-005 (19644) OTU-TD-FX-CS-007-004 (19643) OTU-DT-OC-160-100 (18748) TTC-SP-NTC-SP-010-010-GKS-KS14 (60291)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Opens tests
Series : OTU
Type : Keysight Vectorless Test
Version : nanoVTEP gen 2 SP B/C size
Accessory type : Customising accessory
Scope of delivery : Incl. nanoVTEP Gen2
Width : 4 mm
Height : 48.7 mm
Min. temperature : + 10 °C
Max. temperature : + 60 °C
RoHS-compliant : RoHS-3
Technical data
Stroke : 4 mm
Length : 7 mm
Outer dimensionS (WxDxH) : 7.0 x 4.0 x 48.7 mm
Compatible with
Vacuum test fixtures (VA) : VA 3070S/L, VA 2070S/L
Interchangeable kits (WS) : WS Keysight