Contact terminal A KT-S-031 57 27 Item KT-S031-0001
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Contact terminal A KT-S-031 57 27 Item KT-S031-0001
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Technical data
| Product group : | Contact terminals (KT) |
|---|---|
| Series : | KT-S031 |
| Sub-series : | KT-S031 standard |
| Grid : | 1 mm |
| Type of contact terminal connection : | Wire-grip |
| Magnetic : | Yes |
| Installation type : | Press-in |
| Quick-exchange system : | No |
| Surface area : | A gold |
| Material : | 3 CuBe |
| Knurl : | No |
| RoHS-compliant : | RoHS-3;6c |
| Mounting hole in CEM1 : | 0.55 - 0.57 mm |
|---|---|
| Mounting hole in FR4 : | 0.55 - 0.57 mm |
| Total length : | 27 mm |
|---|---|
| Shaft diameter : | 0.53 mm |
| Latching lug : | No |
| Tip diameter : | 0.36 mm |
|---|
Test probes
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Test probe, INGUN S-Line
S-031 297 040 A 0800 L
Item S-031-0001
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
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Test probe, INGUN S-Line
S-031 291 040 A 2200 S
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- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 291 040 A 1000 S
Item S-031-0002
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 307 040 A 1500 S
Item S-031-0008
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 238 040 A 1500 S
Item S-031-0005
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 305 040 A 1500 S
Item S-031-0009
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 291 040 A 1500 S
Item S-031-0004
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 277 040 A 1500 S
Item S-031-0006
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-031 214 040 A 1500 S
Item S-031-0007
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems