Receptacle A KS-967 60 35 M-R Item KS-9676035M-R

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CAD file (INGUN_KS-967_60_35_M-R.STEP)
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KS-967 60 35 M-R (KS-9676035M-R) INGUN SELECTION
KS-967 60 35 M-R (KS-9676035M-R) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-967
Sub-series : KS-967 M screw-in version
Type of receptacle connection : Plug / open
Press ring : No
Surface area : Gold
Collar diameter : 3.5 mm
Collar height : 0.2 mm
Knurl : Yes
Vacuum-tight : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 2.92 - 2.94 mm
Mounting hole in FR4 : 2.92 - 2.94 mm
Mechanical data
Total length : 6 mm
Outer diameter : 2.75 mm

Test probes for installation height, Test probes 4.60 mm

Spring-loaded test probe GKS-967 215 130 A 1001 M Item GKS-967-0207
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 2001 MC Item GKS-967-0106
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 2001 M Item GKS-967-0087
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available

Test probes for installation height, Test probes 3.00 mm

Spring-loaded test probe GKS-967 305 130 A 1001 M Item GKS-967-0076
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 2001 MC Item GKS-967-0214
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 1001 M Item GKS-967-0110
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 1001 M Item GKS-967-0069
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 2001 MC Item GKS-967-0107
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 MC Item GKS-967-0103
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 2001 M Item GKS-967-0091
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 1001 MC Item GKS-967-0102
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 2001 MC Item GKS-967-0078
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 2001 M Item GKS-967-0044
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 2001 M Item GKS-967-0079
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 M Item GKS-967-0068
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 1001 M Item GKS-967-0083
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 2001 M Item GKS-967-0063
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 2001 MC Item GKS-967-0104
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 1001 MC Item GKS-967-0105
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available