Receptacle KS-364 125 Item KS-364125

Downloads
Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KS-364_125.STEP)
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KS-364 125 (KS-364125)
KS-364 125 (KS-364125) KS-364 23 (KS-36423) RKS-364 23 (RKS-36423)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Receptacles (KS)
Series : KS-364
Sub-series : KS-364 press-in version
Type of receptacle connection : Solder outer surface
Press ring : No
Surface area : Gold
Collar diameter : 6 mm
Collar height : 1 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 5.59 - 5.60 mm
Mounting hole in FR4 : 5.59 - 5.60 mm
Mechanical data
Total length : 12.5 mm
Outer diameter : 5.6 mm

Test probes for installation height, Test probes 7.00 mm

Test Probe GKS-364 206 400 N 8001 Item GKS-364-0020
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 204 400 N 0601 Item GKS-364-0043
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 204 400 N 1501 Item GKS-364-0006
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 205 400 N 8001 Item GKS-364-0014
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 205 400 N 0601 Item GKS-364-0011
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 204 400 N 3001 Item GKS-364-0007
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 206 400 N 1501 Item GKS-364-0018
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 206 400 N 0601 Item GKS-364-0028
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 201 400 N 0601 Item GKS-364-0001
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 201 400 N 1501 Item GKS-364-0002
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 205 400 N 3001 Item GKS-364-0013
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Test Probe GKS-364 201 400 N 3001 Item GKS-364-0003
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 204 400 N 8001 Item GKS-364-0005
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 205 400 N 1501 Item GKS-364-0012
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 201 400 N 8001 Item GKS-364-0004
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-364 206 400 N 3001 Item GKS-364-0019
  • Robust test probes with continuous plunger for applications with unwanted side and axial forces
  • For use in applications with limited space