KS 0.6 µm Au (BG) KS-050 E08 Item KS-050E08
KS 0.6 µm Au (BG) KS-050 E08 Item KS-050E08
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-050 |
| Sub-series : | KS-050 press-in version |
| Type of receptacle connection : | Plug / open |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 1.04 mm |
| Collar height : | 7.9 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 0.98 - 1.00 mm |
|---|---|
| Mounting hole in FR4 : | 0.98 - 1.00 mm |
| Mounting hole with press ring in CEM1 : | 0.98 - 1.00 mm |
| Mounting hole with press ring in FR4 : | 0.98 - 1.00 mm |
| Total length : | 40.6 mm |
|---|---|
| Outer diameter : | 0.95 mm |
Test probes for installation height, Test probes 23.30 mm
Test probes for installation height, Test probes 18.00 mm
slide 1 to 3 of 3
Spring-loaded test probe
GKS-050 291 050 A 1000 LP
Item GKS-050-0334
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 291 050 A 2000 LP
Item GKS-050-0332
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 291 050 A 1500 LP
Item GKS-050-0333
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Test probes for installation height, Test probes 21.30 mm
slide 10 to 14 of 8
Spring-loaded test probe
GKS-015 297 050 A 1500
Item GKS-015-0016
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-015 305 050 A 1500
Item GKS-015-0019
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-015 277 050 A 1500
Item GKS-015-0018
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-015 307 050 A 1500
Item GKS-015-0001
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-015 291 050 A 1000
Item GKS-015-0012
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Test probes for installation height, Test probes 16.00 mm
slide 6 to 10 of 84
Spring-loaded test probe
GKS-050 238 050 A 1000
Item GKS-050-0097
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 201 050 A 2000 C
Item GKS-050-0270
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 214 050 A 2000
Item GKS-050-0002
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 306 090 A 1000
Item GKS-050-0017
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 214 050 A 1500
Item GKS-050-0016
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Test probes for installation height, Test probes 16.30 mm
slide 1 to 4 of 4
Spring-loaded test probe
GKS-050 319 090 A 1000
Item GKS-050-0326
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 319 090 A 2000 C
Item GKS-050-0374
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 319 090 A 2000
Item GKS-050-0328
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 319 090 A 1500
Item GKS-050-0327
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Receptacles
