Receptacle KS-004 30 G Item KS-00430G

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CAD file (INGUN_KS-004_30_G.STEP)
Product datasheet (EN|pdf)
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KS-004 30 G (KS-00430G) INGUN SELECTION
KS-004 30 G (KS-00430G) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-004
Sub-series : KS-004 press-in version
Type of receptacle connection : Solder
Press ring : Yes
Surface area : Gold
Collar diameter : 2.8 mm
Collar height : 7.6 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 2.67 - 2.68 mm
Mounting hole in FR4 : 2.67 - 2.68 mm
Mounting hole with press ring in CEM1 : 2.72 - 2.77 mm
Mounting hole with press ring in FR4 : 2.72 - 2.77 mm
Mechanical data
Total length : 30.5 mm
Outer diameter : 2.69 mm

Test probes for installation height, Test probes 16.50 mm

High-current probe HSS-004 305 396 S 3000 Item HSS-004-0001
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe GKS-004 302 396 A 1500 Item GKS-004-0023
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 201 152 A 1500 Item GKS-004-0001
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 203 396 A 3000 Item GKS-004-0014
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 308 396 A 3000 Item GKS-004-0022
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 201 152 A 3000 Item GKS-004-0008
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 201 152 A 2000 Item GKS-004-0004
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-004 206 396 A 3000
Spring-loaded test probe GKS-004 206 396 A 3000 Item GKS-004-0013
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 305 152 A 1500 Item GKS-004-0026
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 302 396 A 3000 Item GKS-004-0018
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 308 396 A 1500 Item GKS-004-0017
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-004 302 396 A 2000
Spring-loaded test probe GKS-004 302 396 A 2000 Item GKS-004-0019
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 305 152 A 3000 Item GKS-004-0024
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current probe HSS-004 306 396 A 2000 Item HSS-004-0006
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe GKS-004 308 396 A 2000 Item GKS-004-0020
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current probe HSS-004 317 396 A 3000 Item HSS-004-0004
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
High-current probe HSS-004 306 396 A 3000 Item HSS-004-0002
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe GKS-004 204 152 A 2000 Item GKS-004-0021
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current probe HSS-004 319 396 A 2000 Item HSS-004-0007
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe GKS-004 204 152 A 1500 Item GKS-004-0029
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 204 152 A 3000 Item GKS-004-0027
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-004 305 152 A 2000 Item GKS-004-0016
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-004 206 396 A 2000
Spring-loaded test probe GKS-004 206 396 A 2000 Item GKS-004-0005
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current probe HSS-004 319 396 A 3000 Item HSS-004-0003
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
INGUN SELECTION GKS-004 203 396 A 2000
Spring-loaded test probe GKS-004 203 396 A 2000 Item GKS-004-0010
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current probe HSS-004 317 396 A 2000 Item HSS-004-0008
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
INGUN SELECTION GKS-004 206 396 A 1500
Spring-loaded test probe GKS-004 206 396 A 1500 Item GKS-004-0002
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current probe HSS-004 305 396 S 2000 Item HSS-004-0005
  • Trusted, robust high-current probes, optimally sized for current load capacity ratio
  • Low resistance probe with Ri typical: < 10 mOhm
  • For use in function and burn-in tests
  • Large selection of tip styles and spring forces for optimum contact with DUT
  • Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe GKS-004 203 396 A 1500 Item GKS-004-0007
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.