Receptacle KS-002 47 G Item KS-00247G

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Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KS-002_47_G.STEP)
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KS-002 47 G (KS-00247G) INGUN SELECTION
KS-002 30 G (KS-00230G) INGUN SELECTION KS-002 47 G (KS-00247G) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-002
Sub-series : KS-002 press-in version
Type of receptacle connection : Wire-wrap
Press ring : Yes
Surface area : Gold
Collar diameter : 1.78 mm
Collar height : 6.1 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 1.68 - 1.69 mm
Mounting hole in FR4 : 1.68 - 1.69 mm
Mounting hole with press ring in CEM1 : 1.70 - 1.75 mm
Mounting hole with press ring in FR4 : 1.70 - 1.75 mm
Mechanical data
Total length : 33.5 mm
Outer diameter : 1.67 mm

Test probes for installation height, Test probes 12.10 mm

Spring-loaded test probe GKS-002 207 191 A 2800 Item GKS-002-0033
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-002 206 191 A 1000
Spring-loaded test probe GKS-002 206 191 A 1000 Item GKS-002-0008
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 207 191 A 1000 Item GKS-002-0038
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 204 152 A 1800 Item GKS-002-0013
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 207 191 A 1800 Item GKS-002-0039
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-002 303 191 A 1800
Spring-loaded test probe GKS-002 303 191 A 1800 Item GKS-002-0009
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 204 152 A 2800 Item GKS-002-0014
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 206 191 A 2800 Item GKS-002-0010
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 214 191 A 1000 Item GKS-002-0043
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 303 191 A 2800 Item GKS-002-0011
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-002 303 191 A 1000
Spring-loaded test probe GKS-002 303 191 A 1000 Item GKS-002-0004
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 217 191 A 2800 Item GKS-002-0048
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 214 191 A 1800 Item GKS-002-0042
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 204 152 A 1000 Item GKS-002-0005
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-002 201 107 A 1800
Spring-loaded test probe GKS-002 201 107 A 1800 Item GKS-002-0002
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 217 191 A 1800 Item GKS-002-0040
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 305 064 A 2800 Item GKS-002-0024
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 305 064 A 1000 Item GKS-002-0015
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 201 107 A 2800 Item GKS-002-0016
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-002 206 191 A 1800
Spring-loaded test probe GKS-002 206 191 A 1800 Item GKS-002-0006
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-002 201 107 A 1000
Spring-loaded test probe GKS-002 201 107 A 1000 Item GKS-002-0001
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 217 191 A 1000 Item GKS-002-0041
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 214 191 A 2800 Item GKS-002-0045
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-002 305 064 A 1800 Item GKS-002-0017
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.