Receptacle KS-001 47 G Item KS-00147G
Receptacle KS-001 47 G Item KS-00147G
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Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-001 |
| Sub-series : | KS-001 press-in version |
| Type of receptacle connection : | Wire-wrap |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 1.45 mm |
| Collar height : | 4 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 1.31 - 1.32 mm |
|---|---|
| Mounting hole in FR4 : | 1.31 - 1.32 mm |
| Mounting hole with press ring in CEM1 : | 1.36 - 1.40 mm |
| Mounting hole with press ring in FR4 : | 1.36 - 1.40 mm |
| Total length : | 27.5 mm |
|---|---|
| Outer diameter : | 1.32 mm |
Test probes for installation height, Test probes 8.50 mm
Spring-loaded test probe
GKS-001 302 150 A 0600
Item GKS-001-0023
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 303 150 A 0600
Item GKS-001-0020
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 305 100 A 1500
Item GKS-001-0021
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 303 150 A 1500
Item GKS-001-0017
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 204 150 A 1500
Item GKS-001-0022
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 305 100 A 1000
Item GKS-001-0005
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 302 150 A 1500
Item GKS-001-0030
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 306 150 A 1000
Item GKS-001-0001
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 306 150 A 0600
Item GKS-001-0010
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 201 075 A 1000
Item GKS-001-0007
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 306 100 A 1000
Item GKS-001-0003
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 201 075 A 0600
Item GKS-001-0024
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 305 100 A 0600
Item GKS-001-0015
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 307 150 A 1500
Item GKS-001-0018
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 306 100 A 0600
Item GKS-001-0012
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 306 100 A 1500
Item GKS-001-0014
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 204 150 A 0600
Item GKS-001-0032
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 302 150 A 1000
Item GKS-001-0004
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 307 150 A 0600
Item GKS-001-0026
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 303 150 A 1000
Item GKS-001-0011
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 204 150 A 1000
Item GKS-001-0013
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 201 075 A 1500
Item GKS-001-0008
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 306 150 A 1500
Item GKS-001-0002
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-001 307 150 A 1000
Item GKS-001-0016
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.