Insertion and extraction tools GKS (insert) E-SW-ZW-GKS-100 Item E-SW-ZW-GKS-100
Insertion and extraction tools GKS (insert) E-SW-ZW-GKS-100 Item E-SW-ZW-GKS-100
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Technical data
| Product group : | Uses (E) |
|---|---|
| Compatible test probe(s) / receptacle(s) : | 107 GKS-002, E-100, DKS-100, GKS-100, GKS-135, GKS-725, SKS-100 |
| Series : | E-SW-GKS |
| Tool for receptacle (KS) : | No |
| Tool for test probe (GKS) : | Yes |
| Test probe installation type : | Plug-in |
| Max. tip diameter : | 1.5 mm |
| RoHS-compliant : | RoHS-3 |
Test probes
Spring-loaded test probe
GKS-100
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-135
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-100 E
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-100 LP
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Switching probe
SKS-100
- For a wide range of applications: performs components detection check, is a switch for detecting closed/open states, and a signal transmitter for process control
- The electrical connection is ensured by installation using a receptacle
- Designed as normally open (NO), i.e. The circuit is closed when actuated
Spring-loaded test probe
GKS-002
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN E-TYPE®
E-100
- Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
- When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
- Dimensions equivalent to the standard GKS series