Spacer sleeve N DS-810 02 N Item DS-81002N
Spacer sleeve N DS-810 02 N Item DS-81002N
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Technical data
| Product group : | Spacer sleeves (DS) |
|---|---|
| Series : | DS-810 |
| Compatible test probe(s) : | DS-810 |
| Grid : | 6 mm |
| Material : | 1 brass |
| Magnetic : | Yes |
| Surface area : | N nickel |
| RoHS-compliant : | RoHS-3;6c |
| Total length : | 2 mm |
|---|---|
| Inner diameter : | 5.05 mm |
| Outer diameter : | 5.8 mm |
Receptacles
INGUN SELECTION
INGUN SELECTION
Test probes
Spring-loaded test probe
GKS-366 105 400 N 8001
Item GKS-366-0016
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 105 400 N 6001
Item GKS-366-0032
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 204 400 N 3001
Item GKS-364-0007
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Test Probe
GKS-364 201 400 N 3001
Item GKS-364-0003
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 205 400 N 8001
Item GKS-364-0014
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 204 400 N 0601
Item GKS-364-0043
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 206 400 N 3001
Item GKS-364-0019
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 206 400 N 1501
Item GKS-364-0018
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 356 400 A 16001
Item GKS-366-0031
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 356 400 A 8001
Item GKS-366-0029
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 105 400 N 1501
Item GKS-366-0024
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 205 400 N 3001
Item GKS-364-0013
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 206 400 N 0601
Item GKS-364-0028
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 305 400 A 1501
Item GKS-366-0001
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 205 400 N 1501
Item GKS-364-0012
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 105 400 N 3001
Item GKS-366-0025
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
INGUN SELECTION
Switching probe (NO)
SKS-419 005 300 A 6508
Item SKS-419-0001
- For a wide range of applications: performs components detection check, is a switch for detecting closed/open states, and a signal transmitter for process control
- The electrical connection is ensured by installation using a receptacle
- Designed as normally open (NO), i.e. The circuit is closed when actuated
Spring-loaded test probe
GKS-364 201 400 N 8001
Item GKS-364-0004
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 305 400 A 16001
Item GKS-366-0027
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 201 400 N 1501
Item GKS-364-0002
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 204 400 N 8001
Item GKS-364-0005
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Test Probe
GKS-364 206 400 N 8001
Item GKS-364-0020
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 305 400 A 6001
Item GKS-366-0003
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 305 400 A 3001
Item GKS-366-0002
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 201 400 N 0601
Item GKS-364-0001
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 356 400 A 1501
Item GKS-366-0026
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 105 400 N 16001
Item GKS-366-0011
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 305 400 A 8001
Item GKS-366-0004
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 356 400 A 6001
Item GKS-366-0028
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 204 400 N 1501
Item GKS-364-0006
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-364 205 400 N 0601
Item GKS-364-0011
- Robust test probes with continuous plunger for applications with unwanted side and axial forces
- For use in applications with limited space
Spring-loaded test probe
GKS-366 356 400 A 3001
Item GKS-366-0030
- Extremely robust test probes for applications with unwanted side and axial forces
- For use in applications with limited space