Screw-in tool BIT-GKS-967 M-B-K Item BIT-GKS-967M-B-K

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Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_BIT-GKS-967_M-B-K.STEP)
Product datasheet (EN|pdf)
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BIT-GKS-967 M-B-K (BIT-GKS-967M-B-K)
BIT-GKS-075 M (BIT-GKS-075M) INGUN SELECTION BIT-GKS-075 M-B (BIT-GKS-075M-B) INGUN SELECTION BIT-GKS-103 M-900 (BIT-GKS-103M-900) BIT-GKS-112 M-B (BIT-GKS-112M-B) INGUN SELECTION BIT-GKS-113 M (BIT-GKS-113M) INGUN SELECTION BIT-GKS-212 M (BIT-GKS-212M) BIT-GKS-503 M-B (BIT-GKS-503M-B) BIT-GKS-899 M (BIT-GKS-899M) INGUN SELECTION BIT-GKS-899 M-B (BIT-GKS-899M-B) INGUN SELECTION BIT-GKS-050 M-B (BIT-GKS-050M-B) INGUN SELECTION BIT-GKS-112 M (BIT-GKS-112M) INGUN SELECTION BIT-GKS-112 M-B-FP (BIT-GKS-112M-B-FP) BIT-GKS-500 M (BIT-GKS-500M) BIT-GKS-913 M (BIT-GKS-913M) BIT-GKS-913 M-B (BIT-GKS-913M-B) INGUN SELECTION BIT-GKS-097 M (BIT-GKS-097M) BIT-GKS-097 M-B (BIT-GKS-097M-B) BIT-GKS-113 M-800 (BIT-GKS-113M-800) BIT-GKS-113 M-B (BIT-GKS-113M-B) INGUN SELECTION BIT-GKS-503 M (BIT-GKS-503M) INGUN SELECTION BIT-GKS-747 M (BIT-GKS-747M) BIT-GKS-967 M-B-K (BIT-GKS-967M-B-K)
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Technical data
General data
Product group : Bit inserts (BIT)
Compatible test probe(s) / receptacle(s) : 022 GKS-967
Series : BIT-GKS
Tool for receptacle (KS) : No
Tool for test probe (GKS) : Yes
Test probe installation type : Screw-in
Max. tip diameter : 1.3 mm
Tool version : Rigid
Screw-in torque : 3 - 5 cNm
RoHS-compliant : RoHS-3

Test probes

Spring-loaded test probe GKS-967 306 130 A 2001 M Item GKS-967-0079
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 2001 MC Item GKS-967-0107
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 2001 MC Item GKS-967-0104
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 2001 MC Item GKS-967-0214
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 M Item GKS-967-0068
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 1001 M Item GKS-967-0083
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 1001 M Item GKS-967-0207
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 2001 M Item GKS-967-0063
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 2001 M Item GKS-967-0091
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 2001 MC Item GKS-967-0078
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 304 130 A 2001 MC Item GKS-967-0103
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 303 130 A 1001 M Item GKS-967-0110
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 1001 M Item GKS-967-0076
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 2001 M Item GKS-967-0044
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 2001 MC Item GKS-967-0106
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 306 130 A 1001 MC Item GKS-967-0105
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 1001 MC Item GKS-967-0102
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 215 130 A 2001 M Item GKS-967-0087
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 302 130 A 1001 M Item GKS-967-0069
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available