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Product information "OTU-KS-NV-007-004-G2"
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
| Accessory type: | Customising accessories |
|---|---|
| Height: | 48.7 mm [1.91 in] |
| Interchangeable kits (WS): | WS Keysight |
| Length: | 7 mm [.275 in] |
| Max. temperature: | 60 °C [140 °F] |
| Min. temperature: | 10 °C [50 °F] |
| Outer dimensionS (WxDxH): | 7 x 4 x 48.7 mm [.275 x .157 x 1.91 in] |
| Product group: | Opens tests |
| RoHS-compliant: | Yes |
| Scope of delivery: | Incl. nanoVTEP Gen2 |
| Series: | OTU |
| Stroke: | 4 mm [.157 in] |
| Type: | Keysight Vectorless Test |
| Vacuum test fixtures (VA): | VA 2070S/L, VA 3070S/L |
| Version: | nanoVTEP gen 2 SP B/C size |
| Width: | 4 mm [.157 in] |
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Product details
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
Other products in this series:
Technical data
General data
- Product group: Opens tests
- Series: OTU
- Type: Keysight Vectorless Test
- Version: nanoVTEP gen 2 SP B/C size
- Accessory type: Customising accessories
- Scope of delivery: Incl. nanoVTEP Gen2
- Width: 4 mm [.157 in]
- Height: 48.7 mm [1.91 in]
- Min. temperature: 10 °C [50 °F]
- Max. temperature: 60 °C [140 °F]
- RoHS-compliant: Yes
Compatible with
- Vacuum test fixtures (VA): VA 3070S/L, VA 2070S/L
- Interchangeable kits (WS): WS Keysight
Technical data
- Stroke: 4 mm [.157 in]
- Length: 7 mm [.275 in]
- Outer dimensionS (WxDxH): 7 x 4 x 48.7 mm [.275 x .157 x 1.91 in]
Suitable tools and accessories
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