Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT
- Vacuum test fixture with parallel closing vacuum cassette for testing large PCB quantities
- Robust, maintenance-friendly design with outstanding service life
- Available for Keysight i3070 test system
- Increased ease of use without significant closing forces
- Single-stage and dual-stage versions
- Single-stage and dual-stage versions
- Detailed accompanying documents (e.g., customising guidelines)
Vacuum test fixture VA 2070S/i3070-5 Item 4844-KIT
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Technical data
| Product group : | Vacuum test fixture (VA) |
|---|---|
| Main series : | VA xxxx |
| Subseries : | VA 20xx |
| Series : | VA 2070 |
| Size : | xx70 |
| Test fixture type : | Stand-alone test fixture |
| Contact stroke generation : | Vacuum |
| Max. interface signals : | 3666 |
| Interface blocks required : | No |
| Contacting direction : | Single-sided (bottom) |
| Max. contact force : | 11000 N |
| Approx. parallel contact stroke : | 7 mm |
| DUT position (row-column) : | 1,5/22,5 - 00/78 |
| Test system interface : | Keysight i3070-5 |
| Weight : | 12 kg |
| Min. temperature : | + 10 °C |
| Max. temperature : | + 60 °C |
| Low voltage : | No |
| ESD-compliant : | No |
| RoHS-compliant : | RoHS-3;6a;6c |
| Test probe installation height, bottom : | 16 mm |
|---|---|
| Standard version : | Yes |
| Useable area, standard (WxD) : | 305 x 380 mm |
| ESD version : | No |
| Radio frequency version : | No |
| Rigid pin version : | No |
| Dual-stage version : | No |
| Additional contacting unit (ZSK), top : | Yes, with suitable additional option |
| Outer dimensions, closed (WxDxH) : | 465 x 460 x 100 mm |
INGUN SELECTION
Board marker probe
ME-E-R2,0-12-100-K12V
Item 24456
- Compact, robust deisgn
- Precise, adjustable positioning
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Electric drive system
Board marker probe
ME-E-R2,0-12-080-S12V
Item 38371
- Compact, robust deisgn
- Precise, adjustable positioning
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Electric drive system
Board marker probe
ME-P-F1,0-16-054-QS4
Item 29483
- Compact, robust deisgn
- Precise, adjustable positioning
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Pneumatic drive system
INGUN SELECTION
Board marker probe
ME-E-R2,0-12-060-K12V
Item 24447
- Compact, robust deisgn
- Precise, adjustable positioning
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Electric drive system
INGUN SELECTION
Board marker probe
ME-P-S2,0-16-054-QS4
Item 25241
- Compact, robust deisgn
- Precise, adjustable positioning
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Pneumatic drive system
Board marker probe
ME-E-S2,0-12-060-K12V
Item 25251
- Compact, robust deisgn
- Precise, adjustable positioning
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Electric drive system
INGUN SELECTION
Board marker probe
ME-E-R2,0-08-053-2S-BL6V-42V
Item 107376
- Short, compact design
- Marking tip with a new dual scratching engraver
- Precise, adjustable positioning
- Quick-exchange engraving unit
- Operating voltage from 6 V to 42 V
- Permanent marking of various materials
- Outstanding service life, highly resistant to wear
- Typical extraction force from receptacle: 3 N to 9.5 N
nanoVTEP connector test
OTC-KS-NV-SP-155-013
Item 108706
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
nanoVTEP sensor plate 1.2 inch
OTC-KS-NV-SP-031-031
Item 108704
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
Pre-centring pin
VZ-R-12-19-K
Item 20616
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
Pre-centring pin
VZ-R-06-13-K
Item 25519
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
Guide pin
FUS-08-24-38-ST-F-M4
Item 2230
- High-precision guiding pin
- Precise, low-friction contacting
- Centring accuracy of +/- 0.075 mm in combination with guide bush #2196
- Quick, easy installation
Detection - present
FB-ABF-A-S-GKS-2
Item 105850
- Upgrade kits to make operation easier, increase the testing reliability, and to reduce handling times
- Available for manual test fixtures and exchangeable kits
- Wide range of varying functions
nanoVTEP sensor plate 2.5 inch
OTU-KS-NV-065-065
Item 109705
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
DUT support
PAS-02,8-04,0
Item 32995
- Trusted plastic support pins to support PC boards
- Robust, pressure-resistant, trusted design
Interface
SST-PYLON-16
Item 111175
- Robust design for high stability with low deflection when fully loaded
- Centring via hardened bore bushes for optimum accuracy with high contact quality
- Floating suspension on the test fixture for optimum alignment and centring on the receiver
- High flexibility and modularity in terms of signal transmission using interface blocks
Electric stroke counter
EHZ-08-R-49-OM
Item 11224
- Compact built-in counter
- 7-segment LCD display
- Integrated battery
- Manual reset
- Count frequency: 30 Hz or 1 kHz
- Installation dimensions (WxDxH): 44.8 x 48.5 x 22 mm
nanoVTEP single probe 0.4 inch
OTC-KS-NV-SP-010-010
Item 108703
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
nanoVTEP amplifier
OTC-KS-NV-EP
Item 108707
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
Vacuum seal
VD-Z-19-XXX-XXX-2
Item 46795
- Vacuum-free zone seal with variable dimensions
- Compatible with VA 20xx 2-stage test fixtures
nanoVTEP test probe
OTC-KS-NV-GKS
Item 111606
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
INGUN SELECTION
Pre-centring pin
VZ-R-12-22-K-ESD
Item 23056
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
nanoVTEP Connect Check signal C
OTE-KS-NV-064-MUX-REF
Item 108711
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- 2x 64 contacts for connecting up to 64 nanoVTEP probes
nanoVTEP signal conditioner board
OTE-KS-NV-064-MUX
Item 108710
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- 2x 64 contacts for connecting up to 64 nanoVTEP probes
Pre-centring pin
VZ-R-12-42-K-ESD
Item 44253
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
INGUN SELECTION
Pre-centring pin
VZ-R-12-22-K
Item 13781
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
Pre-centring pin
VZ-R-08-41-M-X
Item 2519
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
Detection - contacted
FB-ABF-K-HMK-VAxxxx
Item 3408-KIT
- Abfrage Leiterplatte kontaktiert
- Prozesssichere Statusabfrage
- Quick, easy installation
DUT support
PAS-05,8-03,0-FR4
Item 17806
- Trusted plastic pins to support PCBs
- Robust, pressure-resistant, trusted design
- Typical dissipation resistance from 10^6 to 10^9 Ohm
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
Pressure spring
FED-10,0-16,0-97N-09,0
Item 1571
- Trusted pressure springs, suitable for all test fixtures, exchangeable kits, and interchangeable kits
- Highest spring steel quality for maximum breakage resistance
- Various diameters available
- Various spring forces available
nanoVTEP single probe 0.16 inch
OTC-KS-NV-SP-004-004
Item 108701
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
nanoVTEP single probe B/C Size
OTC-KS-NV-SP-007-004
Item 108702
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
INGUN SELECTION
DUT support
PAS-02,8-05,0
Item 3161
- Trusted plastic pins to support PCBs
- Robust, pressure-resistant, trusted design
- Typical dissipation resistance from 10^6 to 10^9 Ohm
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
nanoVTEP sensor plate 2.5 inch
OTC-KS-NV-SP-065-065
Item 108705
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
Electric stroke counter
EHZ-08-R-32-HE
Item 34865
- Compact built-in counter
- 8-segment LCD display
- Integrated battery
- Manual reset
- Count frequency: 30 Hz
- Installation dimensions (WxDxH): 44.8 x 31.2 x 22 mm
FrameScan Plus amplifier
OTC-TD-FS-EP-GKS
Item 14762
- Trusted components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
Pre-centring pin
VZ-R-08-26-M-X
Item 2518
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
ESD discharge probe
FB-ALS-VAxxxx
Item 4137
- Reliable dissipation of electrostatic discharges that occur as a result of potential differences
- Quick, easy installation
Interface
SST-GR2270/71
Item 109715
- Robust design for high stability with low deflection when fully loaded
- Centring via hardened bore bushes for optimum accuracy with high contact quality
- Floating suspension on the test fixture for optimum alignment and centring on the receiver
- High flexibility and modularity in terms of signal transmission using interface blocks
- For pylon receivers with guide pin D = 10.3 mm
Interface
SST-PYLON-12
Item 109145
- Robust design for high stability with low deflection when fully loaded
- Centring via hardened bore bushes for optimum accuracy with high contact quality
- Floating suspension on the test fixture for optimum alignment and centring on the receiver
- High flexibility and modularity in terms of signal transmission using interface blocks
- For pylon receivers with guide pin D = 9.5 mm
nanoVTEP connector test
OTU-KS-NV-155-013
Item 109706
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
FrameScan Plus 0.375×0.475 inch
OTC-TD-FS-SP-013-010
Item 14763
- Trusted components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
FrameScan FX2.0 amplifier
OTC-TD-FX-EP
Item 26486
- Trusted components for the opens test for capacitive testing of semiconductor chips for breakthroughs, short circuits and solder faults
- Suitable for Keysight (testjet, vtep), teradyne (framescan) and spea (escan) test systems
- Quick, easy installation
Personality pin
PP-INGUN-F
Item 45000
- Trusted personality pins for the assembly of test fixtures with Keysight test system interface
- Flat head, wire-wrap posts, entirely gold-plated
- Typical pitch distance of 3.81 mm (2.5 inches)
- Reliable over several contact cycles and corrosion resistant over many years
Vacuum seal
VD-Z-15-XXX-XXX
Item 46794
- Vacuum-free zone seal with variable dimensions
- Compatible with VA 20xx 1-stage test fixtures
Pre-centring pin
VZ-R-12-50-K
Item 46758
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
INGUN SELECTION
DUT support
PAS-02,8-03,0
Item 17990
- Trusted plastic pins to support PCBs
- Robust, pressure-resistant, trusted design
- Typical dissipation resistance from 10^6 to 10^9 Ohm
- Suitable for use in ESD protection zones (EPA), due to low electrostatic charge
Pre-centring pin
VZ-R-12-28-K
Item 19462
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
nanoVTEP sensor plate 1.2 inch
OTU-KS-NV-031-031
Item 109704
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
INGUN SELECTION
Pre-centring pin
VZ-R-10-13-K
Item 21628
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
INGUN SELECTION
Pre-centring pin
VZ-R-12-22-K-X
Item 42295
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
Pre-centring pin
VZ-R-12-35-K
Item 50021
- Trusted pre-centring for positioning the PCB on the probe field
- HFS-802 H-MTD Kontaktstifte
Side approach mechanism
SAM-M-14-300N-202-145
Item 12306
- Reliable lateral contacting
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Manual actuation
Side approach mechanism
SAM-H7-20-150N-020-077
Item 106220
- Reliable lateral contacting
- Compact, robust design
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Stroke-controlled actuation
- Contacting process takes place at the same time as the PCB contacting
INGUN SELECTION
Side approach mechanism
SAM-H7-16-150N-020-060-S
Item 45680
- Reliable lateral contacting
- Compact, robust design
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Stroke-controlled actuation
- Contacting process takes place at the same time as the PCB contacting
Side approach mechanism
SAM-P-50-068N-082-105
Item 50140
- Reliable lateral contacting
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Pneumatic actuation
Side approach mechanism
SAM-M-14-300N-268-145
Item 12559
- Reliable lateral contacting
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Manual actuation
Side approach mechanism
SAM-M-20-150N-070-063
Item 41070
- Reliable lateral contacting
- Compact, robust design
- Durable, maintenance-free precision guidance
- Space-saving, simple, and precise installation
- Manual actuation