Short-stroke test probes
Ultra-compact, versatile, and directly applicable

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Spring-loaded test probes can be used directly in assemblies or on PC boards in addition to classic test purposes, such as in the ICT /FCT test fields. Therefore, INGUN probes can be used for a wide variety of test applications.

Short-stroke probes (GKS) are often used as charging and transfer probes in battery chargers. These test probes stand out due to their extremely compact design, as well as a low installation height in combination with a high spring force. The short-stroke probes can also be installed with a receptacle to enable easy exchange. Due to the extremely short design, exchange solutions for probes installed directly on the PC board can also be realised without difficulty.

1. Short stroke test probes charge and transfer - Test probe as contact element

Solderable probes (GKS) are soldered directly into PC boards without the need for receptacles. These probes can be used in similar applications as the short-stroke probes, for example, signal and current transmission within an assembly. When soldering the probes, care should be taken to ensure the test probe does not overheat during the soldering process in order to avoid damage to the spring.

2. Solderable test probes - Test probe soldered directly on PCB

These test probes are commonly used to supply signal and current of electronic devices and enable a quick assembly exchange during maintenance.

The short-stroke probes as well as the solderable probes have a variety of advantages:

  • Height and tolerance compensation
  • Compensation of unevenness and parallelism errors
  • Can withstand impacts and vibrations
  • Minimal installation space required
  • High conductivity
  • Excellent chemical resistance
  • Outstanding durability

For quick, reliable assembly of PC boards, it is possible to pack the test probes in tape and reel packaging. This enables the automatic feeding of parts in the pick & place machine.

Test Probe GKS-970 305 130 A 2001 Item GKS-970-0001
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-967 305 130 A 1001 Item GKS-967-0008
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Test Probe GKS-365 206 400 A 1501 Item GKS-365-0010
  • Extremely robust test probes for applications with unwanted side and axial forces
  • For use in applications with limited space
Spring-loaded test probe GKS-967 305 130 A 2001 M Item GKS-967-0044
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Compensation of possible height and component tolerances
  • Secure hold in the receptacle due to threaded connection
  • Stainless steel versions for temperatures from -100 °C up to +200 °C available
Spring-loaded test probe GKS-961 305 050 A 0601 Item GKS-961-0001
  • Short-stroke probes ensure a reliable signal and power supply, as well as a quick exchange of assemblies in case of maintenance
  • For the construction of easily separable electronic interfaces, such as in charging trays for electronic devices
  • Particularly suitable for use in applications where space for overall length is limited
  • Compensation of possible height and component tolerances