nanoVTEP Connect Check signal C OTE-KS-NV-064-MUX-REF Item 108711
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- 2x 64 contacts for connecting up to 64 nanoVTEP probes
nanoVTEP Connect Check signal C OTE-KS-NV-064-MUX-REF Item 108711
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Choose version
OTE-KS-NV-064-MUX-REF (108711)
Here you can optionally configure a new variant:
Technical data
| Product group : | Opens tests |
|---|---|
| Series : | OTE |
| Type : | Keysight Vectorless Test |
| Version : | nanoVTEP Connect Check signal C |
| Accessory type : | Customising accessory |
| Width : | 35.8 mm |
| Height : | 17.4 mm |
| Min. temperature : | + 10 °C |
| Max. temperature : | + 60 °C |
| RoHS-compliant : | RoHS-3 |
| Installation : | Thread M3 |
|---|---|
| Number of poles : | 2x 64 |
| Length : | 230 mm |
| Outer dimensionS (WxDxH) : | 230.0 x 35.8 x 17.4 mm |
| Vacuum test fixtures (VA) : | VA 3070S/L, VA 2070S/L |
|---|---|
| Interchangeable kits (WS) : | WS Keysight |
INGUN SELECTION
Vacuum test fixture
VA 2070S/i3070-5
Item 4844-KIT
- Vacuum test fixture with parallel closing vacuum cassette for testing large PCB quantities
- Robust, maintenance-friendly design with outstanding service life
- Available for Keysight i3070 test system
- Increased ease of use without significant closing forces
- Single-stage and dual-stage versions
- Single-stage and dual-stage versions
- Detailed accompanying documents (e.g., customising guidelines)