Product information "OTE-KS-NV-064-MUX-REF"
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- 2x 64 contacts for connecting up to 64 nanoVTEP probes
| Accessory type: | Customising accessories |
|---|---|
| Height: | 17.4 mm [.685 in] |
| Installation: | Thread M3 |
| Interchangeable kits (WS): | WS Keysight |
| Length: | 230 mm [9.05 in] |
| Max. temperature: | 60 °C [140 °F] |
| Min. temperature: | 10 °C [50 °F] |
| Number of poles: | 2x 64 |
| Outer dimensionS (WxDxH): | 230 x 35.8 x 17.4 mm [9.05 x 1.4 x .685 in] |
| Product group: | Opens tests |
| RoHS-compliant: | Yes |
| Series: | OTE |
| Type: | Keysight Vectorless Test |
| Vacuum test fixtures (VA): | VA 2070S/L, VA 3070S/L |
| Version: | nanoVTEP Connect Check signal C |
| Width: | 35.8 mm [1.4 in] |
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- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- 2x 64 contacts for connecting up to 64 nanoVTEP probes
Other products in this series:
- Product group: Opens tests
- Series: OTE
- Type: Keysight Vectorless Test
- Version: nanoVTEP Connect Check signal C
- Accessory type: Customising accessories
- Width: 35.8 mm [1.4 in]
- Height: 17.4 mm [.685 in]
- Min. temperature: 10 °C [50 °F]
- Max. temperature: 60 °C [140 °F]
- RoHS-compliant: Yes
- Vacuum test fixtures (VA): VA 3070S/L, VA 2070S/L
- Interchangeable kits (WS): WS Keysight
- Installation: Thread M3
- Number of poles: 2x 64
- Length: 230 mm [9.05 in]
- Outer dimensionS (WxDxH): 230 x 35.8 x 17.4 mm [9.05 x 1.4 x .685 in]