Skip to main content Skip to search Skip to main navigation
Product details
  • Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
  • Suitable for all Keysight 307x test systems with software version 9.2 or higher
  • Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
  • 2x 64 contacts for connecting up to 64 nanoVTEP probes

Other products in this series:

Technical data
  • Product group: Opens tests
  • Series: OTE
  • Type: Keysight Vectorless Test
  • Version: nanoVTEP signal conditioner board
  • Accessory type: Customising accessories
  • Width: 25.8 mm [1.01 in]
  • Height: 17.4 mm [.685 in]
  • Min. temperature: 10 °C [50 °F]
  • Max. temperature: 60 °C [140 °F]
  • RoHS-compliant: Yes
  • Vacuum test fixtures (VA): VA 3070S/L, VA 2070S/L
  • Interchangeable kits (WS): WS Keysight
  • Installation: Thread M3
  • Number of poles: 2x 64
  • Length: 230 mm [9.05 in]
  • Outer dimensionS (WxDxH): 230 x 25.8 x 17.4 mm [9.05 x 1.01 x .685 in]
Suitable tools and accessories