Contact terminal A KT-S-075 47 35 Item KT-S075-0001
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Contact terminal A KT-S-075 47 35 Item KT-S075-0001
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Technical data
| Product group : | Contact terminals (KT) |
|---|---|
| Series : | KT-S075 |
| Sub-series : | KT-S075 standard |
| Grid : | 1.91 mm |
| Type of contact terminal connection : | Wire-wrap |
| Magnetic : | Yes |
| Installation type : | Press-in |
| Quick-exchange system : | No |
| Surface area : | A gold |
| Material : | 3 CuBe |
| Knurl : | No |
| RoHS-compliant : | RoHS-3;6c |
| Mounting hole in CEM1 : | 1.31 - 1.33 mm |
|---|---|
| Mounting hole in FR4 : | 1.31 - 1.33 mm |
| Total length : | 35 mm |
|---|---|
| Shaft diameter : | 1.26 mm |
| Latching lug : | No |
| Tip diameter : | 0.64 mm |
|---|
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- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
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S-075 225 130 A 1500 S
Item S-075-0018
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 291 090 A 2200 ES
Item S-075-0043
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 200 A 1500 S
Item S-075-0030
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-075 306 150 A 1500 S
Item S-075-0029
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
