Contact terminal A KT-S-075 47 35 Item KT-S075-0001

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CAD file (INGUN_KT-S-075_47_35.STEP)
Product datasheet (EN|pdf)
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KT-S-075 47 35 (KT-S075-0001)
KT-S-075 47 35 (KT-S075-0001)
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Technical data
General data
Product group : Contact terminals (KT)
Series : KT-S075
Sub-series : KT-S075 standard
Grid : 1.91 mm
Type of contact terminal connection : Wire-wrap
Magnetic : Yes
Installation type : Press-in
Quick-exchange system : No
Surface area : A gold
Material : 3 CuBe
Knurl : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 1.31 - 1.33 mm
Mounting hole in FR4 : 1.31 - 1.33 mm
Mechanical data
Total length : 35 mm
Shaft diameter : 1.26 mm
Latching lug : No
Tip style data
Tip diameter : 0.64 mm
Test probe, INGUN S-Line S-075 303 150 A 1500 S Item S-075-0023
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 225 130 A 1500 S Item S-075-0018
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 2200 ES Item S-075-0043
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 200 A 1500 S Item S-075-0030
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 150 A 1500 S Item S-075-0029
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 201 090 A 1500 S Item S-075-0012
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 1500 L Item S-075-0004
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 050 A 2000 S Item S-075-0051
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 217 170 A 1500 S Item S-075-0017
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 238 090 A 1500 L Item S-075-0005
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 050 A 1500 S Item S-075-0016
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 130 A 1500 L Item S-075-0007
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2200 ES Item S-075-0044
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 2000 L Item S-075-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 201 090 A 2200 ES Item S-075-0036
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2000 S Item S-075-0053
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 238 090 A 1500 S Item S-075-0019
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2000 L Item S-075-0055
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 170 A 1500 S Item S-075-0033
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 1500 S Item S-075-0011
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 225 130 A 2000 S Item S-075-0056
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 2000 S Item S-075-0052
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 319 180 A 1500 S Item S-075-0035
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 204 150 A 1500 S Item S-075-0014
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 314 130 A 2200 ES Item S-075-0048
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 289 050 A 1500 S Item S-075-0026
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 090 A 1500 S Item S-075-0031
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 130 A 2000 L Item S-075-0058
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 209 060 A 2200 ES Item S-075-0037
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 238 090 A 2200 ES Item S-075-0041
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 150 A 1500 L Item S-075-0008
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 150 A 2200 ES Item S-075-0046
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 150 A 1500 S Item S-075-0032
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 277 090 A 2200 ES Item S-075-0042
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 1500 S Item S-075-0021
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 302 150 A 1500 S Item S-075-0022
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 277 090 A 1500 S Item S-075-0020
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 130 A 1500 L Item S-075-0009
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 3000 S Item S-075-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 130 A 1500 S Item S-075-0024
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 150 A 1500 L Item S-075-0010
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 204 090 A 1500 S Item S-075-0013
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 170 A 2200 ES Item S-075-0047
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 305 090 A 1500 S Item S-075-0027
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 209 060 A 1500 S Item S-075-0015
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 050 A 2200 ES Item S-075-0038
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 150 A 1500 S Item S-075-0025
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 307 090 A 2200 ES Item S-075-0045
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 1000 S Item S-075-0059
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 306 130 A 1500 S Item S-075-0028
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 297 090 A 2200 S Item S-075-0054
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 130 A 1500 L Item S-075-0006
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 314 130 A 1500 S Item S-075-0034
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 1000 S Item S-075-0057
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 150 A 2200 ES Item S-075-0040
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 291 090 A 1500 L Item S-075-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-075 214 130 A 2200 ES Item S-075-0039
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems