Test probe, INGUN S-Line S-075 277 090 A 2200 ES Item S-075-0042

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Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_S-075_277_090_A_xx00_ES.STEP)
Product datasheet (EN|pdf)
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S-075 277 090 A 2200 ES (S-075-0042)
S-075 209 060 A 2200 ES (S-075-0037) S-075 214 130 A 2200 ES (S-075-0039) S-075 277 090 A 2200 ES (S-075-0042) S-075 297 090 A 2200 ES (S-075-0044) S-075 307 090 A 2200 ES (S-075-0045) S-075 201 090 A 2200 ES (S-075-0036) S-075 214 150 A 2200 ES (S-075-0040) S-075 291 090 A 2200 ES (S-075-0043) S-075 307 150 A 2200 ES (S-075-0046) S-075 307 170 A 2200 ES (S-075-0047) S-075 314 130 A 2200 ES (S-075-0048) S-075 307 090 A 3000 ES (S-075-0074) S-075 214 050 A 2200 ES (S-075-0038) S-075 238 090 A 2200 ES (S-075-0041)
Here you can optionally configure a new variant:
Technical data
General data
Product group : ICT / FCT (in-circuit test and function test
Sub-product group : INGUN S-Line
Series : S-075 ES standard with increased spring pre-load
Grid : 1.91 mm
Contacting from : Pad, via
Magnetic : Yes
Installation type : Plug-in
Quick-exchange system : Yes
Type of test probe connection : Contact terminal
Adjustable installation height : No
Non-rotating : No
Min. temperature : - 40 °C
Max. temperature : + 80 °C
RoHS-compliant : RoHS-3;6a
Electrical data
Current load capacity / rated current : 5 A
Typical resistance (Ri) : < 20 mOhm
Mechanical data
Total length : 35.81 mm
Barrel diameter : 1.37 mm
Maximum stroke : 6.35 mm
Spring pre-load : 1.44 N
Collar height : 00
Spring force at working stroke : 2.25 N
Working stroke : 4.3 mm
Mounting hole in probe plate (KTP) : 1.39 - 1.41 mm
Mounting hole in S-Line spacer plate (SDP) : min. 1.58 mm
KT designation : KT-S050#KT-S075
Tip style data
Tip style : 77 dagger, aggressive version
Tip diameter : 0.9 mm
Tip style surface : A gold
Tip style material : 2 steel
Contact terminal A KT-S-075 47 35 Item KT-S075-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-050 67 23 Item KT-S050-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal A KT-S-050 47 35 Item KT-S050-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-050 67 24 Item KT-S050-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels