Test probe, INGUN S-Line S-075 297 090 A 2000 L Item S-075-0055

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Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_S-075_297_090_A_xx00_L.STEP)
Product datasheet (EN|pdf)
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S-075 297 090 A 2000 L (S-075-0055)
S-075 214 130 A 2000 L (S-075-0062) S-075 307 130 A 2000 L (S-075-0070) S-075 291 090 A 2000 L (S-075-0001) S-075 307 150 A 2000 L (S-075-0078) S-075 306 130 A 2000 L (S-075-0058) S-075 306 150 A 1500 L (S-075-0008) S-075 307 150 A 0800 L (S-075-0076) S-075 297 090 A 1500 L (S-075-0004) S-075 214 130 A 1500 L (S-075-0006) S-075 306 130 A 1500 L (S-075-0007) S-075 238 090 A 1500 L (S-075-0005) S-075 307 150 A 1500 L (S-075-0010) S-075 238 090 A 2000 L (S-075-0064) S-075 291 090 A 1500 L (S-075-0003) S-075 307 130 A 1500 L (S-075-0009) S-075 297 090 A 2000 L (S-075-0055)
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Technical data
General data
Product group : ICT / FCT (in-circuit test and function test
Sub-product group : INGUN S-Line
Series : S-075 L long version
Grid : 1.91 mm
Contacting from : Pad, via
Magnetic : Yes
Installation type : Plug-in
Quick-exchange system : Yes
Type of test probe connection : Contact terminal
Adjustable installation height : No
Non-rotating : No
Min. temperature : - 40 °C
Max. temperature : + 80 °C
RoHS-compliant : RoHS-3;6a
Electrical data
Current load capacity / rated current : 5 A
Typical resistance (Ri) : < 30 mOhm
Mechanical data
Total length : 39.62 mm
Barrel diameter : 1.37 mm
Maximum stroke : 10.15 mm
Spring pre-load : 0.21 N
Collar height : 00
Spring force at working stroke : 2 N
Working stroke : 8 mm
Mounting hole in probe plate (KTP) : 1.39 - 1.41 mm
Mounting hole in S-Line spacer plate (SDP) : min. 1.58 mm
KT designation : KT-S050#KT-S075
Tip style data
Tip style : 97 4-edged 90° dagger, self-cleaning
Tip diameter : 0.9 mm
Tip style surface : A gold
Tip style material : 2 steel
Contact terminal A KT-S-050 47 35 Item KT-S050-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-050 67 23 Item KT-S050-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal KT-S-050 67 24 Item KT-S050-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels
Contact terminal A KT-S-075 47 35 Item KT-S075-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Compatible with existing socketless systems
  • Variable installation height allows for optimal consideration of different test point levels