Spring-loaded test probe GKS-075 360 090 A 2800 Item GKS-075-0637
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-075 360 090 A 2800 Item GKS-075-0637
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Technical data
Product group : | ICT / FCT (in-circuit test and function test |
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Sub-product group : | Bead probe |
Series : | GKS-075 |
Grid : | 1.91 mm |
Contacting from : | Posts, bead, flat contact |
DUT / contact : | Bead probe |
Magnetic : | Yes |
Installation type : | Plug-in |
Quick-exchange system : | Yes |
Adjustable installation height : | No |
Non-rotating : | No |
Compatible receptacle(s) : | KS-075 |
Min. temperature : | - 40 °C |
Max. temperature : | + 80 °C |
RoHS-compliant : | RoHS-3;6c |
Current load capacity / rated current : | 4 A |
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Typical resistance (Ri) : | < 20 mOhm |
Total length : | 33.1 mm |
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Barrel diameter : | 1.02 mm |
Maximum stroke : | 6.35 mm |
Spring pre-load : | 0.86 N |
Collar height : | 00 |
Spring force at working stroke : | 2.8 N |
Working stroke : | 4.3 mm |
Tip style : | 79 spade, flat, self-cleaning |
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Tip diameter : | 0.64 mm |
Tip style surface : | A gold |
Tip style material : | 3 CuBe |