KS with round post d=0.63 mm KS-075 44 G Item KS-07544G
KS with round post d=0.63 mm KS-075 44 G Item KS-07544G
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Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-075 |
| Sub-series : | KS-075 press-in version |
| Type of receptacle connection : | Round posts |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 1.47 mm |
| Collar height : | 7.6 mm |
| Wire-wrap post length : | 9.8 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 1.30 - 1.32 mm |
|---|---|
| Mounting hole in FR4 : | 1.31 - 1.33 mm |
| Mounting hole with press ring in CEM1 : | 1.39 - 1.40 mm |
| Mounting hole with press ring in FR4 : | 1.39 - 1.40 mm |
| Total length : | 40 mm |
|---|---|
| Outer diameter : | 1.32 mm |
Spring-loaded test probe
GKS-075 297 064 A 2000 E
Item GKS-075-1047
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-075 LH
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-075 LP
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-075
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-075 E
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE®
E-075
- Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
- When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Spring-loaded test probe
GKS-035
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
