KS with a square post and press ring KS-075 47 G 10 Item KS-07547G10

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Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KS-075_47_G10.STEP)
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KS-075 47 G 10 (KS-07547G10) INGUN SELECTION
KS-075 30 G (KS-07530G) INGUN SELECTION KS-075 35 G (KS-07535G) INGUN SELECTION KS-075 44 G (KS-07544G) INGUN SELECTION KS-075 47 G 10 (KS-07547G10) INGUN SELECTION KS-075 30 E03 (KS-07530E03) INGUN SELECTION KS-075 47 E03 (KS-07547E03) INGUN SELECTION KS-075 30 E05 (KS-07530E05) INGUN SELECTION KS-075 47 E05 (KS-07547E05) INGUN SELECTION KS-075 47 G (KS-07547G) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-075
Sub-series : KS-075 press-in version
Type of receptacle connection : Wire-wrap
Press ring : Yes
Surface area : Gold
Collar diameter : 1.47 mm
Collar height : 10 mm
Wire-wrap post length : 10 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 1.30 - 1.32 mm
Mounting hole in FR4 : 1.31 - 1.33 mm
Mounting hole with press ring in CEM1 : 1.39 - 1.40 mm
Mounting hole with press ring in FR4 : 1.39 - 1.40 mm
Mechanical data
Total length : 40 mm
Outer diameter : 1.32 mm
Spring-loaded test probe GKS-075 297 064 A 2000 E Item GKS-075-1047
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-035
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-075 E
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version GKS-075 LH
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version GKS-075 LP
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE® E-075
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
Spring-loaded test probe GKS-075
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles