Spring-loaded test probe GKS-050 360 060 A 2000 Item GKS-050-0127
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 060 A 2000 Item GKS-050-0127
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Technical data
| Product group : | ICT / FCT (in-circuit test and function test |
|---|---|
| Sub-product group : | Bead probe |
| Series : | GKS-050 |
| Grid : | 1.27 mm |
| Contacting from : | Pin, posts, bead |
| DUT / contact : | Bead probe |
| Magnetic : | Yes |
| Installation type : | Plug-in |
| Quick-exchange system : | Yes |
| Adjustable installation height : | No |
| Non-rotating : | No |
| Compatible receptacle(s) : | KS-050 |
| Min. temperature : | - 40 °C |
| Max. temperature : | + 80 °C |
| RoHS-compliant : | RoHS-3;6c |
| Current load capacity / rated current : | 3 A |
|---|---|
| Typical resistance (Ri) : | < 20 mOhm |
| Total length : | 43.2 mm |
|---|---|
| Barrel diameter : | 0.78 mm |
| Maximum stroke : | 6.35 mm |
| Spring pre-load : | 0.55 N |
| Collar height : | 00 |
| Spring force at working stroke : | 2 N |
| Working stroke : | 4.3 mm |
| Tip style : | 60 serrated, small grid |
|---|---|
| Tip diameter : | 0.6 mm |
| Tip style surface : | A gold |
| Tip style material : | 3 CuBe |
