Receptacle, pre-wired KS-050 E08 V-30 Item KS-050E08V-30

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KS-050 E08 V-30 (KS-050E08V-30) INGUN SELECTION
KS-050 30 E08 (KS-05030E08) INGUN SELECTION KS-050 35 E08 (KS-05035E08) INGUN SELECTION KS-050 47 E08 (KS-05047E08) INGUN SELECTION KS-050 E08 (KS-050E08) INGUN SELECTION KS-050 E08 V-30 (KS-050E08V-30) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-050
Sub-series : KS-050 press-in version
Type of receptacle connection : Pre-wired
Press ring : Yes
Surface area : Gold
Collar diameter : 1.04 mm
Collar height : 7.9 mm
Knurl : No
Vacuum-tight : yes (< 1 ccm / min)
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 0.98 - 1.00 mm
Mounting hole in FR4 : 0.98 - 1.00 mm
Mounting hole with press ring in CEM1 : 0.98 - 1.00 mm
Mounting hole with press ring in FR4 : 0.98 - 1.00 mm
Mechanical data
Total length : 40.6 mm
Outer diameter : 0.95 mm
Wiring data
Wire type AWG : 30 type 2
Wire type : Solid
Insulating material : Tefzel
Wire outer diameter : 0.55 mm
Wire length : 1 m
Wire diameter : 0.25 mm
Wire colour : Green
Kink protection : Yes
INGUN SELECTION GKS-050 319 090 A 1500
Spring-loaded test probe GKS-050 319 090 A 1500 Item GKS-050-0327
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 319 090 A 2000 Item GKS-050-0328
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 319 090 A 1000 Item GKS-050-0326
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 319 090 A 2000 C Item GKS-050-0374
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015 305 050 A 1500 Item GKS-015-0019
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015 291 050 A 1000 Item GKS-015-0012
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015 277 050 A 1500 Item GKS-015-0018
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015 297 050 A 1500 Item GKS-015-0016
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015 238 050 A 1500 Item GKS-015-0017
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015 307 050 A 1000 Item GKS-015-0004
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-015 307 050 A 1500
Spring-loaded test probe GKS-015 307 050 A 1500 Item GKS-015-0001
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-015 291 050 A 1500
Spring-loaded test probe GKS-015 291 050 A 1500 Item GKS-015-0011
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 291 050 A 2000 LP
Spring-loaded test probe GKS-050 291 050 A 2000 LP Item GKS-050-0332
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 291 050 A 1000 LP Item GKS-050-0334
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 291 050 A 1500 LP
Spring-loaded test probe GKS-050 291 050 A 1500 LP Item GKS-050-0333
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 201 050 A 2000 Item GKS-050-0079
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 277 050 A 1500 Item GKS-050-0125
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 307 090 A 2000 C Item GKS-050-0114
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 238 050 A 2000 Item GKS-050-0084
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 297 050 A 1500 Item GKS-050-0036
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 302 060 A 1500 Item GKS-050-0122
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 214 050 A 2000 C Item GKS-050-0035
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 050 A 2000 Item GKS-050-0235
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 305 050 A 1000
Spring-loaded test probe GKS-050 305 050 A 1000 Item GKS-050-0018
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 306 090 A 1000
Spring-loaded test probe GKS-050 306 090 A 1000 Item GKS-050-0017
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 305 050 A 2000
Spring-loaded test probe GKS-050 305 050 A 2000 Item GKS-050-0006
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 307 090 A 2000
Spring-loaded test probe GKS-050 307 090 A 2000 Item GKS-050-0010
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 060 A 2000 Item GKS-050-0127
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 090 A 2000 Item GKS-050-0257
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 307 050 A 2000
Spring-loaded test probe GKS-050 307 050 A 2000 Item GKS-050-0011
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 214 050 A 2000
Spring-loaded test probe GKS-050 214 050 A 2000 Item GKS-050-0002
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 277 050 A 2000 Item E-050-0010
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 291 050 A 2000 C Item GKS-050-0030
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 303 090 A 1500
Spring-loaded test probe GKS-050 303 090 A 1500 Item GKS-050-0050
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 303 050 A 1000 Item GKS-050-0076
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 050 A 1000 Item GKS-050-0261
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 222 040 A 2000 Item GKS-050-0115
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 303 090 A 1000
Spring-loaded test probe GKS-050 303 090 A 1000 Item GKS-050-0081
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 291 050 A 2000 Item E-050-0001
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
INGUN SELECTION GKS-050 307 090 A 1500
Spring-loaded test probe GKS-050 307 090 A 1500 Item GKS-050-0009
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 303 050 A 2000 Item GKS-050-0082
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 297 050 A 2000 Item E-050-0005
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Ingun E-Type test probe E-050 238 050 E 2000 Item E-050-0024
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 360 060 A 1500 Item GKS-050-0116
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 291 050 E 2000 Item E-050-0025
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
INGUN SELECTION GKS-050 201 050 A 1500
Spring-loaded test probe GKS-050 201 050 A 1500 Item GKS-050-0252
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 238 050 A 1500 Item GKS-050-0083
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 090 A 1500 Item GKS-050-0254
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 303 050 A 2000 C Item GKS-050-0085
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 201 050 A 2000 C Item GKS-050-0270
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 307 090 A 1000 Item GKS-050-0013
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 307 050 A 1000 Item GKS-050-0014
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 291 050 A 2000
Spring-loaded test probe GKS-050 291 050 A 2000 Item GKS-050-0003
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 307 090 A 2000 Item E-050-0003
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
INGUN SELECTION GKS-050 297 050 A 1000
Spring-loaded test probe GKS-050 297 050 A 1000 Item GKS-050-0027
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 307 050 A 1500 Item GKS-050-0015
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 297 050 A 2000 C Item GKS-050-0128
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 214 050 A 1000
Spring-loaded test probe GKS-050 214 050 A 1000 Item GKS-050-0001
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 291 050 A 1500
Spring-loaded test probe GKS-050 291 050 A 1500 Item GKS-050-0004
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 306 090 A 2000
Spring-loaded test probe GKS-050 306 090 A 2000 Item GKS-050-0008
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 303 090 A 2000
Spring-loaded test probe GKS-050 303 090 A 2000 Item GKS-050-0098
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 222 040 A 1500 Item GKS-050-0236
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 307 050 A 2000 C Item GKS-050-0071
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 238 050 A 2000 Item E-050-0006
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 222 040 A 1000 Item GKS-050-0102
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 303 050 A 1500 Item GKS-050-0096
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 201 050 A 2000 Item E-050-0008
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 238 050 A 1000 Item GKS-050-0097
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 270 026 E 2000 Item E-050-0023
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 231 050 A 1500 Item GKS-050-0023
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 305 050 A 2000 C Item GKS-050-0066
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 302 060 A 1000 Item GKS-050-0132
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 214 050 A 1500
Spring-loaded test probe GKS-050 214 050 A 1500 Item GKS-050-0016
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 302 060 A 2000 C Item GKS-050-0357
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 060 A 1000 Item GKS-050-0131
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 307 050 A 2000 Item E-050-0009
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 302 060 A 2000 Item GKS-050-0130
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 090 A 1000 Item GKS-050-0305
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 303 090 A 2000 C Item GKS-050-0086
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 360 050 A 1500 Item GKS-050-0240
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 291 050 A 1000
Spring-loaded test probe GKS-050 291 050 A 1000 Item GKS-050-0012
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 231 050 A 2000 C Item GKS-050-0124
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 277 050 A 1000 Item GKS-050-0110
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 231 050 A 1000 Item GKS-050-0022
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 379 050 A 2000 Item GKS-050-0242
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 306 090 A 2000 C Item GKS-050-0060
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 379 050 A 1500 Item GKS-050-0251
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 277 050 A 2000 C Item GKS-050-0364
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 277 050 A 2000
Spring-loaded test probe GKS-050 277 050 A 2000 Item GKS-050-0099
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 306 090 A 1500
Spring-loaded test probe GKS-050 306 090 A 1500 Item GKS-050-0007
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050 231 050 A 2000 Item GKS-050-0019
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 201 050 A 1000
Spring-loaded test probe GKS-050 201 050 A 1000 Item GKS-050-0095
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION E-050 214 050 A 2000
Ingun E-Type test probe E-050 214 050 A 2000 Item E-050-0004
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
INGUN SELECTION GKS-050 305 050 A 1500
Spring-loaded test probe GKS-050 305 050 A 1500 Item GKS-050-0005
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Ingun E-Type test probe E-050 297 050 E 2000 Item E-050-0026
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe GKS-050 379 050 A 1000 Item GKS-050-0243
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-050 297 050 A 2000
Spring-loaded test probe GKS-050 297 050 A 2000 Item GKS-050-0025
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-050
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-015
  • Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE® E-050
  • Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
  • When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
  • Dimensions equivalent to the standard GKS series
Spring-loaded test probe, long version GKS-050 LP
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles