Receptacle KS-050 30 E08 Item KS-05030E08
Receptacle KS-050 30 E08 Item KS-05030E08
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Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-050 |
| Sub-series : | KS-050 press-in version |
| Type of receptacle connection : | Solder |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 1.04 mm |
| Collar height : | 7.9 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 0.98 - 1.00 mm |
|---|---|
| Mounting hole in FR4 : | 0.98 - 1.00 mm |
| Mounting hole with press ring in CEM1 : | 0.98 - 1.00 mm |
| Mounting hole with press ring in FR4 : | 0.98 - 1.00 mm |
| Total length : | 40.6 mm |
|---|---|
| Outer diameter : | 0.95 mm |
slide 1 to 4 of 4
INGUN SELECTION
Spring-loaded test probe
GKS-050 319 090 A 1500
Item GKS-050-0327
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 319 090 A 2000
Item GKS-050-0328
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 319 090 A 1000
Item GKS-050-0326
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 319 090 A 2000 C
Item GKS-050-0374
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
slide 10 to 14 of 8
INGUN SELECTION
Spring-loaded test probe
GKS-015 291 050 A 1500
Item GKS-015-0011
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-015 307 050 A 1000
Item GKS-015-0004
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-015 291 050 A 1000
Item GKS-015-0012
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-015 307 050 A 1500
Item GKS-015-0001
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-015 238 050 A 1500
Item GKS-015-0017
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
slide 1 to 3 of 3
INGUN SELECTION
Spring-loaded test probe
GKS-050 291 050 A 2000 LP
Item GKS-050-0332
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 291 050 A 1000 LP
Item GKS-050-0334
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 291 050 A 1500 LP
Item GKS-050-0333
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
slide 6 to 10 of 84
Spring-loaded test probe
GKS-050 297 050 A 2000 C
Item GKS-050-0128
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION
Spring-loaded test probe
GKS-050 297 050 A 2000
Item GKS-050-0025
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 277 050 A 2000 C
Item GKS-050-0364
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 303 050 A 1500
Item GKS-050-0096
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-050 303 050 A 1000
Item GKS-050-0076
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
