INGUN offers an extensive portfolio of accessories for the customisation of test fixtures. In addition to the components already presented, customers will find the following additional products for individualised customisations and specific applications.
Screwing units
Using screwing units (SBE), space-saving alignment of adjustable screw-in devices can be performed during testing. Activation is performed manually.
Button activators
Button activators (TAB) can be used for the space saving activation of buttons and spring-loaded switches during testing. Activation is performed manually.
Pushrods
Pushrods (NHS) are used in customisations in order to secure electronic printed circuit boards in the test fixture against the force of the test probes during contacting. Pushrods are mounted in the pressure frame plate.
Transfer fields
Transfer fields (TF) are mounted on the pressure frame plate and/or moving plate, and are used for the transmission of signals from top and/or lateral contacting. The transfer is spring-loaded, which means that the pressure frame plate and/or moving plate can be removed without disrupting the wiring.
PCB support pins
PCB support pins (PAS) are used to support the printed circuit board to be tested and are mounted on the moving plate.
Tooling pins
Tooling pins (FS) are used to mount printed circuit boards to be tested via the tooling holes, and to position them precisely at the contacting level in the probe field.
Pre-centring pins
Pre-centring pins (VZ) are mounted onto the moving plate, and are used as insertion aids to pre-position DUTs simply and quickly on the probe field.
Springs
Springs (FED) are mounted on the probe plate and are used as a pressure element in order to lift the probe plate with the DUT back to the original level following contacting.
Gas pressure springs
Gas pressure springs (GDF) are used to counterbalance weights and are used as supportive opening and holding mechanisms in test fixtures.
Multipoint connectors
Multipoint connectors (VG) are used as pluggable connectors for multi-pole electrical signal transmission in low-voltage applications, such as for connecting the PCB contacting to the test system.
Cleaning mats
Cleaning mats (KRM) are used to clean contaminated test probe tips – a simple measure that helps to prolong the life span of the test probes, especially those with pointed plunger tip styles.
Additional customising parts
INGUN offers customers other accessory parts for test fixture customisation. These include: guide bushes (FUB) and guide pins (FUS), stroke-limiting disk and stroke-limiting pin (HBS), ESD kits, stroke sensors (HMK), snap-on fasteners, stroke counters (HZ), LED analysers, fibre optic cables (LWL), compressed air hoses (PUN), Test probes for interfaces, contact terminals (KT) for interfaces and transfer fields
Connectors and test plugs
Connectors (STK) and test plugs (PS) are used for reliable, low-wear contacting of connectorson electronic assemblies.
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
- Suitable for all Keysight 307x test systems with software version 9.2 or higher
- Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology
- 2x 64 contacts for connecting up to 64 nanoVTEP probes
- Trusted cleaning mats for cleaning contaminated test probe tips
- Easy way to extend the service life of test probes
- Ideal for pointed, aggressive plunger tips with self-cleaning properties
- Size can be adjusted to fit probe field