Contact terminal KT-S-039 67 22 Item KT-S039-0003
New
Contact terminal KT-S-039 67 22 Item KT-S039-0003
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Technical data
| Product group : | Contact terminals (KT) |
|---|---|
| Series : | KT-S039 |
| Sub-series : | KT-S039 standard |
| Grid : | 1 mm |
| Type of contact terminal connection : | Wireless |
| Magnetic : | Yes |
| Installation type : | Press-in |
| Quick-exchange system : | No |
| Surface area : | A gold |
| Knurl : | No |
| RoHS-compliant : | RoHS-3;6c |
| Mounting hole in CEM1 : | 0.80 - 0.82 mm |
|---|---|
| Mounting hole in FR4 : | 0.80 - 0.82 mm |
| Total length : | 22.25 mm |
|---|---|
| Shaft diameter : | 0.76 mm |
| Latching lug : | No |
| Tip diameter : | 0.49 mm |
|---|
Test probe, INGUN S-Line
S-039 201 050 A 2200 ES
Item S-039-0015
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 214 028 A 2200 ES
Item S-039-0007
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 291 050 A 2200 ES
Item S-039-0005
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 277 050 A 1300 L
Item S-039-0018
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 297 050 A 1300 L
Item S-039-0017
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 214 050 A 1500 S
Item S-039-0010
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 238 050 A 2200 ES
Item S-039-0004
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 291 050 A 1300 L
Item S-039-0001
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 297 050 A 0800 S
Item S-039-0022
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 297 050 A 2200 ES
Item S-039-0013
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 307 050 A 1300 L
Item S-039-0019
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 297 050 A 2200 S
Item S-039-0021
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 214 050 A 2200 ES
Item S-039-0009
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 305 050 A 1500 S
Item S-039-0006
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 214 028 A 1500 S
Item S-039-0008
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 277 050 A 1500 S
Item S-039-0012
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 297 050 A 1500 S
Item S-039-0014
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 201 050 A 1500 S
Item S-039-0016
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 238 050 A 1500 S
Item S-039-0003
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 291 050 A 1500 S
Item S-039-0002
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
Test probe, INGUN S-Line
S-039 277 050 A 2200 ES
Item S-039-0011
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems