Contact terminal A KT-S-039 57 27 Item KT-S039-0001

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Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KT-S-039_57_27.STEP)
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KT-S-039 57 27 (KT-S039-0001)
KT-S-039 67 22 (KT-S039-0003) KT-S-039 57 27 (KT-S039-0001) KT-S-039 67 21 (KT-S039-0002)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Contact terminals (KT)
Series : KT-S039
Sub-series : KT-S039 standard
Grid : 1 mm
Type of contact terminal connection : Wire-grip
Magnetic : Yes
Installation type : Press-in
Quick-exchange system : No
Surface area : A gold
Material : 3 CuBe
Knurl : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 0.80 - 0.82 mm
Mounting hole in FR4 : 0.80 - 0.82 mm
Mechanical data
Total length : 27 mm
Shaft diameter : 0.75 mm
Latching lug : No
Tip style data
Tip diameter : 0.49 mm
Test probe, INGUN S-Line S-039 214 028 A 2200 ES Item S-039-0007
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 214 050 A 2200 ES Item S-039-0009
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 214 028 A 1500 S Item S-039-0008
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 201 050 A 2200 ES Item S-039-0015
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 238 050 A 1500 S Item S-039-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 307 050 A 1300 L Item S-039-0019
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 201 050 A 1500 S Item S-039-0016
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 291 050 A 1300 L Item S-039-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 305 050 A 1500 S Item S-039-0006
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 297 050 A 2200 S Item S-039-0021
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 297 050 A 1500 S Item S-039-0014
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 291 050 A 1500 S Item S-039-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 238 050 A 2200 ES Item S-039-0004
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 277 050 A 1300 L Item S-039-0018
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 277 050 A 2200 ES Item S-039-0011
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 297 050 A 0800 S Item S-039-0022
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 214 050 A 1500 S Item S-039-0010
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 297 050 A 1300 L Item S-039-0017
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 291 050 A 2200 ES Item S-039-0005
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 297 050 A 2200 ES Item S-039-0013
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-039 277 050 A 1500 S Item S-039-0012
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems