Contact terminal A KT-S-031 57 27 Item KT-S031-0001

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Conformation of RoHS compliance (EN|PDF)
CAD file (INGUN_KT-S-031_57_27.STEP)
Product datasheet (EN|pdf)
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KT-S-031 57 27 (KT-S031-0001)
KT-S-031 57 27 (KT-S031-0001) KT-S-031 67 20 (KT-S031-0002)
Here you can optionally configure a new variant:
Technical data
General data
Product group : Contact terminals (KT)
Series : KT-S031
Sub-series : KT-S031 standard
Grid : 1 mm
Type of contact terminal connection : Wire-grip
Magnetic : Yes
Installation type : Press-in
Quick-exchange system : No
Surface area : A gold
Material : 3 CuBe
Knurl : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 0.55 - 0.57 mm
Mounting hole in FR4 : 0.55 - 0.57 mm
Mechanical data
Total length : 27 mm
Shaft diameter : 0.53 mm
Latching lug : No
Tip style data
Tip diameter : 0.36 mm
Test probe, INGUN S-Line S-031 238 040 A 0800 L Item S-031-0003
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 297 040 A 0800 L Item S-031-0001
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 291 040 A 2200 S Item S-031-0010
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 291 040 A 1000 S Item S-031-0002
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 307 040 A 1500 S Item S-031-0008
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 238 040 A 1500 S Item S-031-0005
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 305 040 A 1500 S Item S-031-0009
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 291 040 A 1500 S Item S-031-0004
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 277 040 A 1500 S Item S-031-0006
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems
Test probe, INGUN S-Line S-031 214 040 A 1500 S Item S-031-0007
  • Use of larger test probes for increased contacting accuracy and longer service life
  • Minimal grid dimensions due to omission of receptacles (socketless)
  • Large selection of tip styles and spring forces for optimal contact with the test point
  • Compatible with existing socketless systems