KS for GKS-100 293: inst. height 16.0mm KS-100 47 93 Item KS-1004793
KS for GKS-100 293: inst. height 16.0mm KS-100 47 93 Item KS-1004793
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Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-100 |
| Sub-series : | KS-100 press-in version |
| Type of receptacle connection : | Wire-wrap |
| Press ring : | No |
| Surface area : | Gold |
| Collar diameter : | 1.8 mm |
| Collar height : | 0.2 mm |
| Wire-wrap post length : | 9.3 mm |
| Knurl : | No |
| Vacuum-tight : | yes (< 1 ccm / min) |
| RoHS-compliant : | RoHS-3;6c |
| Mounting hole in CEM1 : | 1.68 - 1.69 mm |
|---|---|
| Mounting hole in FR4 : | 1.69 - 1.70 mm |
| Total length : | 37.9 mm |
|---|---|
| Outer diameter : | 1.67 mm |
High-current probe
HSS-100
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-100 E
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-135
- Long-stroke test probe for implementing combined ICT and FCT in a dual-stage fixture
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe
GKS-100
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe, long version
GKS-100 LP
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
- Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
- Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN E-TYPE®
E-100
- Highest contact reliability under challenging test conditions without additional stress on the DUT: up to 25% larger contact surface between test probe and DUT
- When hitting the test surface a spring force up to 100% higher than a standard GKS is available, but the same spring force as a standard GKS is achieved at the working stroke.
- Dimensions equivalent to the standard GKS series
