Receptacle A KS-040 E08 Item KS-040E08

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Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KS-040_E08.STEP)
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KS-040 E08 (KS-040E08) INGUN SELECTION
KS-040 E08 (KS-040E08) INGUN SELECTION KS-040 E08 V-30 (KS-040E08V-30) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-040
Sub-series : KS-040 press-in version
Type of receptacle connection : Plug / open
Press ring : Yes
Surface area : Gold
Collar diameter : 0.82 mm
Collar height : 7.9 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3;6c
Mounting hole
Mounting hole in CEM1 : 0.79 - 0.80 mm
Mounting hole in FR4 : 0.79 - 0.80 mm
Mechanical data
Total length : 33 mm
Outer diameter : 0.77 mm
Spring-loaded test probe GKS-040 207 040 A 0800 Item GKS-040-0041
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-040 291 040 A 0800 Item GKS-040-0038
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-040 297 040 A 0800
Spring-loaded test probe GKS-040 297 040 A 0800 Item GKS-040-0001
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-040 304 040 A 0800
Spring-loaded test probe GKS-040 304 040 A 0800 Item GKS-040-0006
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-040 214 040 A 0800 Item GKS-040-0040
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-040 277 040 A 0800 Item GKS-040-0042
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-040 238 040 A 0800 Item GKS-040-0014
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-040 222 032 A 0800 Item GKS-040-0005
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
INGUN SELECTION GKS-040 305 040 A 0800
Spring-loaded test probe GKS-040 305 040 A 0800 Item GKS-040-0002
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles
Spring-loaded test probe GKS-040 297 040 A 0800 LP Item GKS-040-0027
  • Well-established test probes for contacting PCBs
  • For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.
  • Various spring forces available as well as versions with stainless steel springs suitable for high temperatures
  • Used for setting the optimum stroke conditions in the test fixture, various installation heights can be achieved by combining test probes and receptacles