Receptacle KS-004 30 G Item KS-00430G
Receptacle KS-004 30 G Item KS-00430G
Please log in to show the price
Login
The prices listed in the scale are displayed rounded, therefore deviation in the total price is possible.
Shipping costs
* The prices are rounded to two decimal places.
Technical data
| Product group : | Receptacles (KS) |
|---|---|
| Series : | KS-004 |
| Sub-series : | KS-004 press-in version |
| Type of receptacle connection : | Solder |
| Press ring : | Yes |
| Surface area : | Gold |
| Collar diameter : | 2.8 mm |
| Collar height : | 7.6 mm |
| Knurl : | No |
| Vacuum-tight : | No |
| RoHS-compliant : | RoHS-3 |
| Mounting hole in CEM1 : | 2.67 - 2.68 mm |
|---|---|
| Mounting hole in FR4 : | 2.67 - 2.68 mm |
| Mounting hole with press ring in CEM1 : | 2.72 - 2.77 mm |
| Mounting hole with press ring in FR4 : | 2.72 - 2.77 mm |
| Total length : | 30.5 mm |
|---|---|
| Outer diameter : | 2.69 mm |
High-current test probe
HSS-004 305 396 S 3000
Item HSS-004-0001
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 302 396 A 1500
Item GKS-004-0023
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 201 152 A 1500
Item GKS-004-0001
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 203 396 A 3000
Item GKS-004-0014
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 308 396 A 3000
Item GKS-004-0022
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 201 152 A 3000
Item GKS-004-0008
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 201 152 A 2000
Item GKS-004-0004
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 206 396 A 3000
Item GKS-004-0013
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 305 152 A 1500
Item GKS-004-0026
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 302 396 A 3000
Item GKS-004-0018
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 308 396 A 1500
Item GKS-004-0017
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 302 396 A 2000
Item GKS-004-0019
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 305 152 A 3000
Item GKS-004-0024
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-004 306 396 A 2000
Item HSS-004-0006
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 308 396 A 2000
Item GKS-004-0020
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-004 317 396 A 3000
Item HSS-004-0004
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
High-current test probe
HSS-004 306 396 A 3000
Item HSS-004-0002
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 204 152 A 2000
Item GKS-004-0021
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-004 319 396 A 2000
Item HSS-004-0007
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 204 152 A 1500
Item GKS-004-0029
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 204 152 A 3000
Item GKS-004-0027
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 305 152 A 2000
Item GKS-004-0016
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe
GKS-004 206 396 A 2000
Item GKS-004-0005
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-004 319 396 A 3000
Item HSS-004-0003
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 203 396 A 2000
Item GKS-004-0010
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-004 317 396 A 2000
Item HSS-004-0008
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 206 396 A 1500
Item GKS-004-0002
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
High-current test probe
HSS-004 305 396 S 2000
Item HSS-004-0005
- Trusted, robust high-current probes, optimally sized for current load capacity ratio
- Low-Ohm probe with Ri typical: < 10 mOhm
- For use in function and burn-in tests
- Large selection of tip styles and spring forces for optimum contact with DUT
- Optimum adjustment of the stroke ratios in the test fixture: The test probe collar is available in different heights, which, in combination with the receptacles, allows a range of installation heights
Spring-loaded test probe
GKS-004 203 396 A 1500
Item GKS-004-0007
- Robust, compact design for harsh ICT/FCT applications with limited space
- For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.